參數(shù)資料
型號(hào)： EVAL-ADUC7039QSPZ
廠商： Analog Devices Inc
文件頁數(shù)： 42/92頁
文件大?。?/td> 0K
描述： BOARD EVAL FOR ADUC7039
設(shè)計(jì)資源： ADuC7039QSPZ Gerber Files
EVAL-ADuC7039 Schematic & Brd Outline
標(biāo)準(zhǔn)包裝： 1
系列： QuickStart™ PLUS 套件
類型： MCU
適用于相關(guān)產(chǎn)品： ADuC7039
所含物品： 板
Data Sheet
ADuC7039
Rev. D | Page 47 of 92
The fast temperature option cannot be used on the first con-
version after ADC power-on. It can only be set after at least
the first ADC interrupt. Waiting for a valid ADC result is
not necessary. Also, a restriction when using the fast tempera-
ture mode is to ensure that SF >=1. In addition, a conversion
rate of 1 ms is recommended in this mode of operation. This is
to ensure the fast result occurs simultaneously with the current
channel result.
When changing the ADCs configuration, by writing ADCMDE,
ADC0CON or ADCFLT, the fast temperature bit must also be
cleared to ensure correct operation. This condition is similar to
a first conversion after ADC power-on.
I-ADC DIAGNOSTICS
The ADuC7039 features the capability to detect open-circuit
conditions on the application board. This is accomplished using
the two current sources on IIN+ and IIN; these are controlled
via ADC0CON[14:13].
Note that these current sources have a tolerance of ±30%.
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