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參數(shù)資料
| 型號： | ADUC7032BSTZ-8V-RL |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 43/128頁 |
| 文件大小： | 0K |
| 描述： | IC BATTERY SENSOR PREC 48-LQFP |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | MicroConverter® ADuC7xxx |
| 核心處理器： | ARM7 |
| 芯體尺寸： | 16/32-位 |
| 速度： | 20.48MHz |
| 連通性： | LIN，SPI，UART/USART |
| 外圍設(shè)備： | POR，PSM，溫度傳感器，WDT |
| 輸入/輸出數(shù)： | 9 |
| 程序存儲器容量： | 96KB（48K x 16） |
| 程序存儲器類型： | 閃存 |
| RAM 容量： | 1.5K x 32 |
| 電壓 - 電源 (Vcc/Vdd)： | 3.5 V ~ 18 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 2x16b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 105°C |
| 封裝/外殼： | 48-LQFP |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 其它名稱： | ADUC7032BSTZ-8V-RLDKR |
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Preliminary Technical Data
ADuC7032
Rev. PrD | Page 21 of 128
SPECIFICATION TERMINOLOGY
CONVERSION RATE:
The conversion rate specifies the rate at which an output result
is available from the ADC, once the ADC has settled.
The sigma-delta conversion techniques used on this part mean
that while the ADC front-end signal is over-sampled at a
relatively high sample rate, a subsequent digital filter is
employed to decimate the output to give a valid 16-Bit data
conversion result at output rates from 1Hz to 8 KHz.
It should also be noted that when software switches from one
input to another (on the same ADC), the digital filter must first
be cleared and then allowed to average a new result. Depending
on the configuration of the ADC and the type of filter this can
take multiple conversion cycles.
INTEGRAL NON_LINEARITY (INL):
This is the maximum deviation of any code from a straight line
passing through the endpoints of the transfer function. The
endpoints of the transfer function are zero scale, a point 0.5
LSB below the first code transition and full scale, a point 0.5
LSB above the last code transition (111 . . . 110 to 111 . . . 111).
The error is expressed as a percentage of full scale.
NO MISSING CODES:
This is a measure of the Differential Non-Linearity of the ADC.
The error is expressed in bits and specifies the number of codes
(ADC results) as 2^N Bits, where is N = No Missing Codes,
guaranteed to occur through the full ADC input range.
OFFSET ERROR:
This is the deviation of the first code transition ADC input
voltage from the ideal first code transition.
OFFSET ERROR DRIFT:
Offset Error Drift is the variation in absolute offset error with
respect to temperature. This error is expressed as LSBs per °C.
GAIN ERROR
This is a measure of the span error of the ADC. It is a measure
of the difference between the measured and the ideal span
between any two points in the transfer function.
OUTPUT NOISE:
The output noise is specified as the standard deviation (or 1 X
Sigma) of ADC output codes distribution collected when the
ADC input voltage is at a dc voltage. It is expressed as rms.
The output or RMS noise can be used to calculate the Effective
Resolution of the ADC as defined by the following equation
Effective Resolution
= Log 2 (Full-Scale Range / RMS Noise) Bits
The peak-to-peak noise is defined as the deviation of codes that
fall within 6.6 X Sigma of the distribution of ADC output codes
collected when the ADC input voltage is at dc. The peak-to-
peak noise is therefore calculated as 6.6 times the RMS noise.
The peak-to-peak noise can be used to calculate the ADC
(Noise Free, Code) Resolution for which there will be no code
flicker within a 6.6-Sigma limit as defined by the following
equation
Noise Free Code Resolution
= Log 2 (Full-Scale Range / Peak to
Peak Noise) Bits
Acronyms used in this Datasheet:
ADC
Analog to Digital Converter
ARM
Advanced RISC Machine
JTAG
Joint Test Action Group
LIN
Local Interconnect Network
LSB
Least Significant Byte/Bit
LVF
Low Voltage Flag
MCU
MicroController
MMR
Memory Mapped Register
MSB
Most Significant Byte/Bit
PID
Protected Identifier
POR
Power On Reset
PSM
Power Supply Monitor
RMS
Root Mean Square
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