參數(shù)資料
型號: ADUC7032BSTZ-8V-RL
廠商: Analog Devices Inc
文件頁數(shù): 29/128頁
文件大?。?/td> 0K
描述: IC BATTERY SENSOR PREC 48-LQFP
標準包裝: 1
系列: MicroConverter® ADuC7xxx
核心處理器: ARM7
芯體尺寸: 16/32-位
速度: 20.48MHz
連通性: LIN,SPI,UART/USART
外圍設備: POR,PSM,溫度傳感器,WDT
輸入/輸出數(shù): 9
程序存儲器容量: 96KB(48K x 16)
程序存儲器類型: 閃存
RAM 容量: 1.5K x 32
電壓 - 電源 (Vcc/Vdd): 3.5 V ~ 18 V
數(shù)據(jù)轉換器: A/D 2x16b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 105°C
封裝/外殼: 48-LQFP
包裝: 標準包裝
其它名稱: ADUC7032BSTZ-8V-RLDKR
Preliminary Technical Data
ADuC7032
Rev. PrD | Page 124 of 128
ADUC7032 ON-CHIP DIAGNOSTICS
The ADuC7032 integrates multiple diagnostic support circuits on-chip. These circuits allow the device to test core digital functionality,
analog front-end and high-voltage I/O ports in-circuit.
ADC Diagnostics
Internal Test Voltage
The current channel can be configured to convert on an internal 8.3mV test voltage . On any gain range the result should be within
±0.5% of the expected result.
Internal Short Mode
The current and voltage input channels can also be shorted internally. Converting on the internal short will allow an assessment of the
internal ADC noise to be determined.
Internal Current Sources
Internal current sources can also be enabled on both current and temperature channels. These current sources can be used to determine
external short or open circuit conditions in both external shunt or temperature sensor configurations.
High Voltage I/O Diagnostics
High Voltage I/O Read back
All high voltage I/O pins are supported with read back capability. This allows the detection of external short conditions.
High Voltage Current Detection
All high voltage I/O pins also have a high current detection capability allowing high side connections to VBAT to be detected and
controlled.
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