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參數(shù)資料
| 型號： | PERICOMPI7C8150 |
| 廠商： | Pericom Semiconductor Corp. |
| 英文描述： | 2-Port PCI-to-PCI Bridge |
| 中文描述： | 2端口PCI至PCI橋 |
| 文件頁數(shù)： | 94/106頁 |
| 文件大?。?/td> | 904K |
| 代理商： | PERICOMPI7C8150 |
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PI7C8150
2-PORT PCI-TO-PCI BRIDGE
ADVANCE INFORMATION
84
August 22, 2002 – Revision 1.02
Figure 16-1. Test Access Port Block Diagram
16.1.1
TAP PINS
The PI7C8150’s TAP pins form a serial port composed of four input connections (TMS,
TCK, TRST_L and TDI) and one output connection (TDO). These pins are described in
Table 17-1. The TAP pins provide access to the instruction register and the test data
registers.
16.1.2
INSTRUCTION REGISTER
The Instruction Register (IR) holds instruction codes. These codes are shifted in through
the Test Data Input (TDI) pin. The instruction codes are used to select the specific test
operation to be performed and the test data register to be accessed.
The instruction register is a parallel-loadable, master/slave-configured 5-bit wide, serial-
shift register with latched outputs. Data is shifted into and out of the IR serially through the
TDI pin clocked by the rising edge of TCK. The shifted-in instruction becomes active upon
latching from the master stage to the slave stage. At that time the IR outputs along with the
TAP finite state machine outputs are decoded to select and control the test data register
selected by that instruction. Upon latching, all actions caused by any previous instructions
terminate.
The instruction determines the test to be performed, the test data register to be accessed, or
both. The IR is two bits wide. When the IR is selected, the most significant bit is connected
to TDI, and the least significant bit is connected to TDO. The value presented on the TDI
pin is shifted into the IR on each rising edge of TCK. The TAP controller captures fixed
parallel data (1101 binary). When a new instruction is shifted in through TDI, the value
1101(binary) is always shifted out through TDO, least significant bit first. This helps
identify instructions in a long chain of serial data from several devices.
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