
MOTOROLA
Illustrations
xxxvii
ILLUSTRATIONS
Figure
Number
Title
Page
Number
10-82
10-83
10-84
10-85
10-86
11-1
11-2
11-3
11-4
12-1
12-2
12-3
12-4
12-5
12-6
13-1
13-2
13-3
13-4
13-5
13-6
13-7
13-8
13-9
13-10
13-11
13-12
14-1
14-2
14-3
14-4
14-5
14-6
14-7
14-8
14-9
14-10
14-11
14-12
14-13
14-14
14-15
14-16
Refresh Cycle (CBR) to EDO DRAM...................................................................10-98
Exception Cycle For EDO DRAM........................................................................10-99
Pipelined Bus Operation and Memory Access in 60x-Compatible Mode...........10-103
External Master Access (GPCM) ........................................................................10-104
External Master Configuration with SDRAM Device.........................................10-105
L2 Cache in Copy-Back Mode................................................................................11-2
External L2 Cache in Write-Through Mode............................................................11-4
External L2 Cache in ECC/Parity Mode .................................................................11-6
Read Access with L2 Cache....................................................................................11-9
Test Logic Block Diagram.......................................................................................12-2
TAP Controller State Machine ................................................................................12-3
Output Pin Cell (O.Pin) ...........................................................................................12-4
Observe-Only Input Pin Cell (I.Obs).......................................................................12-4
Output Control Cell (IO.CTL).................................................................................12-5
General Arrangement of Bidirectional Pin Cells.....................................................12-5
MPC8260 CPM Block Diagram..............................................................................13-3
Communications Processor (CP) Block Diagram ...................................................13-5
RISC Controller Configuration Register (RCCR)...................................................13-8
RISC Time-Stamp Control Register (RTSCR)........................................................13-9
RISC Time-Stamp Register (RTSR) .....................................................................13-10
CP Command Register (CPCR).............................................................................13-11
Dual-Port RAM Block Diagram............................................................................13-15
Dual-Port RAM Memory Map ..............................................................................13-16
RISC Timer Table RAM Usage ............................................................................13-19
RISC Timer Command Register (TM_CMD).......................................................13-20
TM_CMD Field Descriptions................................................................................13-21
RISC Timer Event Register (RTER)/Mask Register (RTMR)..............................13-21
SI Block Diagram....................................................................................................14-2
Various Configurations of a Single TDM Channel.................................................14-5
Dual TDM Channel Example..................................................................................14-6
Enabling Connections to the TSA ...........................................................................14-8
One TDM Channel with Static Frames and Independent Rx and Tx Routes..........14-9
One TDM Channel with Shadow RAM for Dynamic Route Change...................14-10
SIx RAM Entry Fields...........................................................................................14-10
Using the SWTR Feature.......................................................................................14-12
Example: SIx RAM Dynamic Changes, TDMa and b, Same SIx RAM Size.......14-16
SI Global Mode Registers (SIxGMR) ...................................................................14-17
SI Mode Registers (SIxMR)..................................................................................14-18
One-Clock Delay from Sync to Data (xFSD = 01)................................................14-20
No Delay from Sync to Data (xFSD = 00)............................................................14-20
Falling Edge (FE) Effect When CE = 1 and xFSD = 01 .......................................14-21
Falling Edge (FE) Effect When CE = 0 and xFSD = 01 .......................................14-21
Falling Edge (FE) Effect When CE = 1 and xFSD = 00 .......................................14-22