參數(shù)資料
型號: K4N56163QF-GC
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 256Mbit gDDR2 SDRAM
中文描述: 片256Mbit GDDR2 SDRAM的
文件頁數(shù): 30/73頁
文件大?。?/td> 1262K
代理商: K4N56163QF-GC
- 30 -
Rev 1.6 (Apr. 2005)
256M gDDR2 SDRAM
K4N56163QF-GC
For proper operation of adjust mode, WL = RL - 1 = AL + CL - 1 clocks and tDS/tDH should be met as the following timing
diagram. For input data pattern for adjustment, DT0 - DT3 is a fixed order and "not affected by
MRS addressing mode (ie. sequential or interleave).
Drive Mode
Drive mode, both Drive(1) and Drive(0), is used for controllers to measure gDDR2 SDRAM Driver impedance. In this
mode, all outputs are driven out tOIT after “enter drive mode” command and all output drivers are turned-off tOIT after
“OCD calibration mode exit” command as the following timing diagram.
1
1
0
0
0
1
1
0
Increase by 1 step
Decrease by 1 step
Decrease by 1 step
Decrease by 1 step
Reserved
Other Combinations
NOP
NOP
NOP
NOP
EMRS
D
T0
V
IL
(DC)
CMD
CK
DQS_in
DQ_in
tDS tDH
WL
OCD adjust mode
OCD calibration mode exit
D
T1
D
T2
D
T3
WR
EMRS
NOP
NOP
CK
DQS
DM
V
IL
(AC)
V
IH
(AC)
V
IH
(DC)
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