參數(shù)資料
型號: S29WS128N0LBFW010
廠商: SPANSION LLC
元件分類: PROM
英文描述: 256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
中文描述: 8M X 16 FLASH 1.8V PROM, 70 ns, PBGA84
封裝: 11.60 X 8 MM, LEAD FREE, PLASTIC, FBGA-84
文件頁數(shù): 40/95頁
文件大小: 1745K
代理商: S29WS128N0LBFW010
October 29, 2004 S29WSxxxN_00_F0
45
Pre l i m i n a r y
Table 7.34. DQ6 and DQ2 Indications
Reading Toggle Bits DQ6/DQ2.
Whenever the system initially begins reading toggle bit sta-
tus, it must read DQ7–DQ0 at least twice in a row to determine whether a toggle bit is
toggling. Typically, the system would note and store the value of the toggle bit after the first
read. After the second read, the system would compare the new value of the toggle bit with
the first. If the toggle bit is not toggling, the device has completed the program or erases
operation. The system can read array data on DQ7–DQ0 on the following read cycle. However,
if after the initial two read cycles, the system determines that the toggle bit is still toggling,
the system also should note whether the value of DQ5 is high (see the section on DQ5). If it
is, the system should then determine again whether the toggle bit is toggling, since the toggle
bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling,
the device has successfully completed the program or erases operation. If it is still toggling,
the device did not complete the operation successfully, and the system must write the reset
command to return to reading array data. The remaining scenario is that the system initially
determines that the toggle bit is toggling and DQ5 has not gone high. The system may con-
tinue to monitor the toggle bit and DQ5 through successive read cycles, determining the
status as described in the previous paragraph. Alternatively, it may choose to perform other
system tasks. In this case, the system must start at the beginning of the algorithm when it
returns to determine the status of the operation. Refer to Figure 7.33 for more details.
DQ5: Exceeded Timing Limits.
DQ5 indicates whether the program or erase time has ex-
ceeded a specified internal pulse count limit. Under these conditions DQ5 produces a “1,”
indicating that the program or erase cycle was not successfully completed. The device may
output a “1” on DQ5 if the system tries to program a “1” to a location that was previously
programmed to “0.” Only an erase operation can change a “0” back to a “1.” Under this con-
dition, the device halts the operation, and when the timing limit has been exceeded, DQ5
produces a “1.”Under both these conditions, the system must write the reset command to re-
turn to the read mode (or to the erase-suspend-read mode if a bank was previously in the
erase-suspend-program mode).
DQ3: Sector Erase Timeout State Indicator.
After writing a sector erase command se-
quence, the system may read DQ3 to determine whether or not erasure has begun. (The
sector erase timer does not apply to the chip erase command.) If additional sectors are se-
lected for erasure, the entire time-out also applies after each additional sector erase
command. When the time-out period is complete, DQ3 switches from a “0” to a “1.” If the
time between additional sector erase commands from the system can be assumed to be less
than tSEA, the system need not monitor DQ3. See Sector Erase Command Sequence for more
details.
If device is
and the system reads
then DQ6
and DQ2
programming,
at any address,
toggles,
does not toggle.
actively erasing,
at an address within a sector
selected for erasure,
toggles,
also toggles.
at an address within sectors not
selected for erasure,
toggles,
does not toggle.
erase suspended,
at an address within a sector
selected for erasure,
does not toggle,
toggles.
at an address within sectors not
selected for erasure,
returns array data,
returns array data. The system can
read from any sector not selected for
erasure.
programming in
erase suspend
at any address,
toggles,
is not applicable.
相關(guān)PDF資料
PDF描述
S29WS256N0PBAW011 256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
S29WS256N0LBFI011 256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
S2L40U 1.4 A, SILICON, RECTIFIER DIODE
S2SD-05-24-L-02.75-SR 10 CONTACT(S), FEMALE, TWO PART BOARD CONNECTOR, IDC, SOCKET
S2SD-05-24-L-02.75-S 10 CONTACT(S), FEMALE, TWO PART BOARD CONNECTOR, IDC, SOCKET
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
S29WS128N0LBFW011 制造商:SPANSION 制造商全稱:SPANSION 功能描述:256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
S29WS128N0LBFW012 制造商:SPANSION 制造商全稱:SPANSION 功能描述:256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
S29WS128N0LBFW013 制造商:SPANSION 制造商全稱:SPANSION 功能描述:256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
S29WS128N0LBFW110 制造商:SPANSION 制造商全稱:SPANSION 功能描述:256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY
S29WS128N0LBFW111 制造商:SPANSION 制造商全稱:SPANSION 功能描述:256/128/64 MEGABIT CMOS 1.8 VOLT ONLY SIMULTANEOUS READ/WRITE BURST MODE FLASH MEMORY