參數(shù)資料
型號： LM98640W-MPR
廠商： NATIONAL SEMICONDUCTOR CORP
元件分類： 模擬信號調(diào)理
英文描述： SPECIALTY ANALOG CIRCUIT, CQFP68
封裝： CERAMIC, QFP-68
文件頁數(shù)： 49/50頁
文件大小： 1688K
代理商： LM98640W-MPR
Absolute Maximum Ratings
Supply Voltage (VDD33)
4.2V
Supply Voltage (VDD18)
2.35V
Voltage on any VDD33 Input Pin
(Not to exceed 4.2V)
-0.3V to
(VDD33 + 0.3V)
Voltage on any VDD33 Output Pin
(Not to exceed 4.2V)
-0.3V to
(VDD33 + 0.3V)
Voltage on any VDD18 Input Pin
(Not to exceed 2.35V)
-0.3V to
(VDD18 + 0.3V)
Voltage on any VDD18 Output Pin
(Not to exceed 2.35V)
-0.3V to
(VDD18 + 0.3V)
Input Current at any pin other than
Supply Pins (Note 3)
±25 mA
Package Input Current (except Supply
Pins) (Note 3)
±50 mA
Maximum Junction Temperature (TA)
150°C
Thermal Resistance (Note 4)
(θ
JA) @ 225 LFPM
11.1°C/W
(θ
JA) @ 0 LFPM
16.5°C/W
(θ
JC)
1.2°C/W
ESD Rating (Note 5)
Human Body Model
2500V
Machine Model
250V
Storage Temperature
-65°C to +150°C
Soldering process must comply with National
Semiconductor’s Reflow Temperature Profile
specifications. Refer to www.national.com/packaging.
Operating Ratings (Note 1, Note 2)
Operating Temperature Range
-55°C
≤ T
A ≤ +125°C
VDD33
+3.15V to +3.45V
VDD18
+1.7V to +1.9V
| VSS33 - VSS18 |
≤100mV
Quality Conformance Inspection
MIL-STD-883, Method 5005 - Group A
Subgroup
Description
Temp (°C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
12
Setting time at
+25
13
Setting time at
+125
14
Setting time at
-55
www.national.com
8
LM98640QML
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