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參數(shù)資料
| 型號： | DS3105LN+ |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 8/124頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC TIMING LINE CARD 64-LQFP |
| 產(chǎn)品培訓(xùn)模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標(biāo)準(zhǔn)包裝： | 160 |
| 類型： | 定時(shí)卡 IC，多路復(fù)用器 |
| PLL： | 是 |
| 主要目的： | 以太網(wǎng)，SONET/SDH，Stratum，電信 |
| 輸入： | CMOS，LVDS，LVPECL，TTL |
| 輸出： | CMOS，LVDS，LVPECL，TTL |
| 電路數(shù)： | 1 |
| 比率 - 輸入:輸出： | 5:2 |
| 差分 - 輸入:輸出： | 無/是 |
| 頻率 - 最大： | 312.5MHz |
| 電源電壓： | 1.62 V ~ 1.98 V |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 64-LQFP |
| 供應(yīng)商設(shè)備封裝： | 64-LQFP（10x10） |
| 包裝： | 托盤 |
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DS3105
105
9.2
JTAG TAP Controller State Machine Description
This section discusses the operation of the TAP controller state machine. The TAP controller is a finite state
machine that responds to the logic level at JTMS on the rising edge of JTCLK. Each of the states denoted in
Figure 9-2 is described in the following paragraphs.
Test-Logic-Reset. Upon device power-up, the TAP controller starts in the Test-Logic-Reset state. The instruction
register contains the IDCODE instruction. All system logic on the device operates normally.
Run-Test-Idle. Run-Test-Idle is used between scan operations or during specific tests. The instruction register and
all test registers remain idle.
Select-DR-Scan. All test registers retain their previous state. With JTMS low, a rising edge of JTCLK moves the
controller into the Capture-DR state and initiates a scan sequence. JTMS high moves the controller to the Select-
IR-SCAN state.
Capture-DR. Data can be parallel-loaded into the test register selected by the current instruction. If the instruction
does not call for a parallel load or the selected test register does not allow parallel loads, the register remains at its
current value. On the rising edge of JTCLK, the controller goes to the Shift-DR state if JTMS is low or to the Exit1-
DR state if JTMS is high.
Shift-DR. The test register selected by the current instruction is connected between JTDI and JTDO and data is
shifted one stage toward the serial output on each rising edge of JTCLK. If a test register selected by the current
instruction is not placed in the serial path, it maintains its previous state.
Exit1-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state,
which terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Pause-DR
state.
Pause-DR. Shifting of the test registers is halted while in this state. All test registers selected by the current
instruction retain their previous state. The controller remains in this state while JTMS is low. A rising edge on
JTCLK with JTMS high puts the controller in the Exit2-DR state.
Exit2-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state
and terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Shift-DR
state.
Update-DR. A falling edge on JTCLK while in the Update-DR state latches the data from the shift register path of
the test registers into the data output latches. This prevents changes at the parallel output because of changes in
the shift register. A rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS
high, the controller enters the Select-DR-Scan state.
Select-IR-Scan. All test registers retain their previous state. The instruction register remains unchanged during this
state. With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and initiates a scan
sequence for the instruction register. JTMS high during a rising edge on JTCLK puts the controller back into the
Test-Logic-Reset state.
Capture-IR. The Capture-IR state is used to load the shift register in the instruction register with a fixed value. This
value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller enters the
Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller enters the Shift-IR state.
Shift-IR. In this state, the instruction register’s shift register is connected between JTDI and JTDO and shifts data
one stage for every rising edge of JTCLK toward the serial output. The parallel register and the test registers
remain at their previous states. A rising edge on JTCLK with JTMS high moves the controller to the Exit1-IR state.
A rising edge on JTCLK with JTMS low keeps the controller in the Shift-IR state, while moving data one stage
through the instruction shift register.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| DS3105LN+ | 功能描述:計(jì)時(shí)器和支持產(chǎn)品 Line Card Timing IC RoHS:否 制造商:Micrel 類型:Standard 封裝 / 箱體:SOT-23 內(nèi)部定時(shí)器數(shù)量:1 電源電壓-最大:18 V 電源電壓-最小:2.7 V 最大功率耗散: 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝:Reel |
| DS3106 | 制造商:MAXIM 制造商全稱:Maxim Integrated Products 功能描述:Line Card Timing IC |
| DS3106A10SL3S(621) | 制造商:Amphenol Corporation 功能描述: |
| DS3106A14S2S | 制造商:Amphenol Corporation 功能描述: |
| DS3106A14S2S(621) | 制造商:Amphenol Corporation 功能描述: |
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