參數(shù)資料
型號(hào): STLC7545
廠商: 意法半導(dǎo)體
英文描述: Enhanced V.34 BIS Analog Front-End(單片模擬前端)
中文描述: 國(guó)際清算銀行增強(qiáng).34模擬前端(單片模擬前端)
文件頁(yè)數(shù): 33/53頁(yè)
文件大?。?/td> 378K
代理商: STLC7545
VI - PROGRAMMABLE FUNCTIONS
(continued)
VI.1.16- PhaseShift Frequency
Table26 :
PhaseShift Frequency
TxCR3 Register
Phase Shift Frequency (1)
FSHIFT = Fsx / W
(Average updated master clock frequency)
W
(INI)
Fsx/2 (INI) (FQ
±
Fsx/2 )
Fsx (FQ
±
Fsx)
D7
V2
-
-
D6
V1
-
-
D5
V0
-
-
D4
W
0
1
D3
HQ1
-
-
D2
HQ0
-
-
D1
Ts0
-
-
D0
DL
-
-
INI : initial value
Note 1 :
The W bit selects the phase shift frequency of theTxDPLL, and hence the capture range
VI.1.17- TransmitTest Programming
Table27 :
Transmit Test Programming
TxCR3 Register
D4
W
Test Modes
D7
V2
D6
V1
D5
V0
D3
HQ1
0
-
-
0
1
1
D2
HQ0
0
-
-
1
0
1
D1
Ts0
0
-
1
-
-
-
D0
DL
0
1
-
-
-
-
Normal Mode (INI)
Digital Loop Test (1)
Test 0 (Internal use only)
Test 1 (Internal use only)
Test 2 (Internal use only)
HALF-INTEGER Q DIVIDER (see Table 18) (2)
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
INI : initial value
Notes :
1. To perform the digital loop test, the single serial interface and band split modes should be selected, the signal at TxD0 pin should
be connected to the RxDI pin, and the Fsx should be equal to the Fsr. Under these conditions, the A/DC input will appear at the
outputon theD/AC. This test is useful to verify the performance of the ADC, DAC and IIRfilters.
2. Test pin EOCMODE must be set to ”0” inthis configuration.
STLC7545
33/53
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