參數(shù)資料
型號: ST7FLIT19B
廠商: 意法半導(dǎo)體
英文描述: 8-Bit MCU With Single Voltage Flash Memory, Data EEPROM, ADC, 5 Timers, SPI(內(nèi)部RC,PLL,ADC,ROP,ICP, IAP,SPI的8位MCU)
中文描述: 8位微控制器單電壓閃存存儲器,數(shù)據(jù)EEPROM,模數(shù)轉(zhuǎn)換器,5計時器和SPI(內(nèi)部鋼筋,鎖相環(huán),藝發(fā)局,人事,電感,國際檢察官聯(lián)合會的SPI的8位微控制器)
文件頁數(shù): 125/155頁
文件大小: 2968K
代理商: ST7FLIT19B
ST7LITE1xB
125/155
EMC CHARACTERISTICS
(Cont’d)
13.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity. For more details, re-
fer to the application note AN1181.
13.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
Absolute Maximum Ratings
Note:
1.
Data based on characterization results, not tested in production.
13.7.3.2 Static and Dynamic Latch-Up
LU
: 3 complementary static tests are required
on 6 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin) and a current injection (applied to
each input, output and configurable I/O pin) are
performed on each sample. This test conforms
to the EIA/JESD 78 IC latch-up standard. For
more details, refer to the application note
AN1181.
Electrical Sensitivities
Symbol
Ratings
Conditions
Maximum value
1)
Unit
V
ESD(HBM)
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Machine Model)
T
A
=
+25°C
8000
V
V
ESD(MM)
T
A
=
+25°C
400
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
T
A
=
+25°C
T
A
=
+85°C
A
A
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