參數(shù)資料
型號(hào): SCANSTA101
廠商: National Semiconductor Corporation
英文描述: RES 30K OHM 1/16W 0.1% 0402 SMD
中文描述: 低壓主STA的IEEE 1149.1標(biāo)準(zhǔn)
文件頁(yè)數(shù): 30/31頁(yè)
文件大小: 403K
代理商: SCANSTA101
Testability Details - IEEE 1149.1 Support
An 8 instruction Tap Controller will be used to accomplish the
IEEE 1149.1 support design.
TABLE 36. Supported IEEE 1149.1 Instruction Set
Instruction Mnemonic
EXTEST
SAMPLE/PRELOAD
Binary Instruction Code
000
001
Description
Allows off-chip circuitry and interconnect to be tested.
Allows snapshot of normal operation. Also allows data to be
loaded on parallel output boundary scan registers.
Places device in bypass mode so that there is single shift register
stage between TDI and TDO.
Allows scanning of the device identification register.
Tristates all output drivers with the exception of TDO.
Allows the state of the signals driven from component pins to be
determined from the boundary-scan register while the BYPASS
register is selected as the serial path between TDI and TDO.
Enables on chip BIST logic to perform memory BIST.
Allows the assertion of internal test_mode signal to prevent the
asynchronous resets from inadvertantly resetting the flip-flops
during internal scan.
BYPASS
111
IDCODE
HIGHZ
CLAMP
010
011
100
RUNBIST
SCANTEST
110
101
TABLE 37. IDCODE Register Description
Version
"0000"
Part Number
"1111 1100 0001 0111"
Manufacturer Identity
"000 0000 1111"
Start Bit
"1"
TABLE 38. Boundary Scan Register Definition
BSR
Bit#
0
1
2
3
4
5
6
7
8
9
Signal Name
BSR
Bit#
10
11
12
13
14
15
16
17
18
19
Signal Name
BSR
Bit#
20
21
22
23
24
25
26
27
28
29
Signal Name
BSR
Bit#
30
31
32
33
34
Signal Name
SCK
RST
R/W
STB
CE
DTACK
INT
DATA[15]
DATA[14]
DATA[13]
DATA[12]
DATA[11]
DATA[10]
DATA[9]
DATA[8]
DATA[7]
DATA[6]
DATA[5]
DATA[4]
DATA[3]
DATA[2]
DATA[1]
DATA[0]
TDO_SM
TMS_SM
TCK_SM
TRST0_SM
TDI_SM
OE
TRIST
ADDRESS[4]
ADDRESS[3]
ADDRESS[2]
ADDRESS[1]
ADDRESS[0]
BIST SUPPORT
The memory BIST can be initiated through JTAG interface
using the RUNBIST instruction or by setting the Onboard
Memory BIST bit in the Start register. When the memory
BIST is initiated through the JTAG interface the result of
pass/fail will be set in the Memory BIST Result bit in the
Status register and also in the BIST status register that can
be accessed through the JTAG interface. The BIST status
register is a one bit register and is connected in the serial
path of TDO and TDI when RUNBIST instruction is scanned
into the instruction register. Once the BIST is done the
contents of the BIST status register can be scanned out to
determine whether the memory BIST passed or failed. If the
memory BIST is initiated through the Onboard Memory BIST
bit in the Start register the result of pass/fail will be set only
in the BIST Result bit in the status register. The memory
BIST will initialize the memory to zero.
SCAN METHODOLOGy
The STA101 supports internal scan through the shared ports
SCAN_EN, SCAN_IN, SCAN_OUT. Before initiating an in-
ternal scan test the user should scan in SCANTEST instruc-
tion through the JTAG interface so that an internal test-
_mode signal can be asserted. This test_mode signal is
used to prevent the reset from inadvertantly resetting the
flip-flops during internal scan. The test vectors to verify the
scan chain are generated by the Sunrise test tool. The target
for the stuck-at fault coverage is 97% and the achieved fault
coverage is about 99%.
S
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