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Agere Systems Inc.
Data Sheet
June 2002
TMXF28155 Supermapper
155/51 Mbits/s SONET/SDH x28/x21 DS1/E1
1 Features
(continued)
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Alarm reporting and performance monitoring per
AT&T
,
ANSI
, ITU-T, and ETSI standards.
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Facility data link features:
— HDLC or transparent access for either ESF or
DDS + FDL frame formats.
— Register/stack access for
SLC
-96 transmit and re-
ceive data.
— Extended superframe (ESF): automatic transmis-
sion of the ESF performance report messages
(PRM). Automatic transmission of the
ANSI
T1.403 ESF performance report messages. Auto-
matic detection and transmission of the
ANSI
T1.403 ESF FDL bit-oriented codes.
— Register/stack access for all CEPT Sa bits trans-
mit and receive data.
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HDLC features:
— HDLC or transparent mode.
— Programmable logical channel assignment: any
time slot, any bit for ISDN D-channel, also inserts/
extracts C-channels for V5.1, V5.2 interfaces.
— 64 logical channels in both transmit and receive di-
rection (any framing format).
— Maximum channel data rate: 64 kbits/s.
— Minimum channel data rate: 4 kbits/s (DS1-FDL or
E1 Sa bit).
— 128-byte FIFO per channel in both transmit and re-
ceive direction.
— Tx to Rx loopback supported.
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System interfaces:
— Concentration highway interface: single clock and
frame sync signals; programmable clock rates at
2.048 MHz, 4.096 MHz, 8.192 MHz, and
16.384 MHz; programmable data rates at
2.048 Mbits/s, 4.096 Mbits/s, and 8.192 Mbits/s;
programmable clock edges and bit/byte offsets.
— Parallel system bus interface at 19.44 MHz for
data and signaling: single clock and frame sync
signals.
— Time-division multiplex data rate serial interface at
1.544 MHz or 2.048 MHz. Twenty-eight receive
data, clock, and frame sync signals. Twenty-eight
transmit data signals with a global clock and frame
sync.
— Network serial multiplexed interface minimal pin
count serial interface at 51.84 MHz optimized for
data and IMA applications.
1.11 System Test and Maintenance
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A variety of loopback modes implemented on
SONET/SDH side, as well as on framer level.
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Built-in test pattern generator and monitor config-
urable for simultaneously testing E1, DS1, DS2, and
DS3 (one channel each).
1.12 Microprocessor Interface
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20-bit address and 16-bit data interface with 16 MHz
to 60 MHz read and write access.
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Compatible with most industry-standard processors.
1.13 Chip Testing and Maintenance
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IEEE
1149.1 JTAG boundary scan.
1.14 Interface to Other Agere Devices
Seamless interface to the following Agere Systems’
device:
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TADM042G5.