參數(shù)資料
型號: PC7410M16
英文描述: PC7410M16 [Updated 12/02. 35 Pages]
中文描述: PC7410M16 [更新12/02。 35頁]
文件頁數(shù): 5/35頁
文件大?。?/td> 361K
代理商: PC7410M16
5
PC7410M16
2183A–HIREL–12/02
Efficient Data Flow
All data buses between VRF, load/store unit, dL1, iL1, L2 and the bus are
128 bits wide
dL1 is fully pipelined to provide 128 bits per cycle to/from the VRF
L2 is fully pipelined to provide 128 bits per L2 clock cycle to the L1s
Up to eight outstanding out-of-order cache misses between dL1 and L2/bus
Up to seven outstanding out-of-order transactions on the bus
Load folding to fold new dL1 misses into older outstanding load and store
misses to the same line
Store miss merging for multiple store misses to the same line. Only
coherency action taken (i.e., address only) for store misses merged to all 32
bytes of a cache line (no data tenure needed).
Two-entry finished store queue and four-entry completed store queue
between load/store unit and dL1
Separate additional queues for efficient buffering of outbound data (castouts,
write throughs, etc.) from dL1 and L2
Bus Interface
MPX bus extension to 60X processor interface
Mode-compatible with 60x processor interface
32-bit address bus
64-bit data bus
Bus-to-core frequency multipliers of 2x, 2.5x, 3x, 3.5x, 4x, 4.5x, 5x, 5.5x, 6x,
6.5x, 7x, 7.5x, 8x, 9x supported
Selectable interface voltages of 1.8V, 2.5V and 3.3V
Power Management
Low-power design with thermal requirements very similar to PC740 and
PC750
Low voltage 1.8V processor core
Selectable interface voltages of 1.8V can reduce power in output buffers
Three static power saving modes: doze, nap, and sleep
Dynamic power management
Testability
LSSD scan design
IEEE 1149.1 JTAG interface
Array built-in self test (ABIST) – factory test only
Redundancy on L1 data arrays and L2 tag arrays
Reliability and Serviceability
Parity checking on 60x and L2 cache buses
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