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參數(shù)資料
| 型號： | DS3160 |
| 元件分類： | 通信及網(wǎng)絡 |
| 英文描述： | Ultraframer DS3/E3/DS2/E2/DS1/E1/DS0 |
| 中文描述： | Ultraframer DS3/E3/DS2/E2/DS1/E1/DS0 |
| 文件頁數(shù)： | 88/107頁 |
| 文件大?。?/td> | 592K |
| 代理商： | DS3160 |
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DS3160
88 of 107
Capture-DR
Data can be parallel-loaded into the test data registers selected by the current instruction. If the instruction
does not call for a parallel load or the selected register does not allow parallel loads, the test register
remains at its current value. On the rising edge of JTCLK, the controller goes to the Shift-DR state if
JTMS is low or it goes to the Exit1-DR state if JTMS is high.
Shift-DR
The test data register selected by the current instruction is connected between JTDI and JTDO and shifts
data one stage towards its serial output on each rising edge of JTCLK. If a test register selected by the
current instruction is not placed in the serial path, it maintains its previous state.
Exit1-DR
While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state
that terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the
Pause-DR state.
Pause-DR
Shifting of the test registers is halted while in this state. All test registers selected by the current
instruction retains their previous state. The controller remains in this state while JTMS is low. A rising
edge on JTCLK with JTMS high puts the controller in the Exit2-DR state.
Exit2-DR
While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state
and terminates the scanning process. A rising edge on JTCLK with JTMS low enters the Shift-DR state.
Update-DR
A falling edge on JTCLK while in the Update-DR state latches the data from the shift register path of the
test registers into the data output latches. This prevents changes at the parallel output due to changes in
the shift register. A rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state.
With JTMS high, the controller enters the Select-DR-Scan state.
Select-IR-Scan
All test registers retain their previous state. The instruction register remains unchanged during this state.
With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and initiates a
scan sequence for the instruction register. JTMS high during a rising edge on JTCLK puts the controller
back into the Test-Logic-Reset state.
Capture-IR
The Capture-IR state is used to load the shift register in the Instruction register with a fixed value. This
value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller
enters the Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller enters the Shift-IR
state.
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| DS3161 | 功能描述:網(wǎng)絡控制器與處理器 IC Sgl ATM/Packet PHYs for DS3/E3/STS-1 RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS31612 | 制造商:Maxim Integrated Products 功能描述:12 PORT ATM/PHY 676-TEPBGA - Trays |
| DS31612N | 制造商:Maxim Integrated Products 功能描述:12 PORT ATM/PHY 676-TEPBGA IND - Trays |
| DS3161N | 功能描述:網(wǎng)絡控制器與處理器 IC Sgl ATM/Packet PHYs for DS3/E3/STS-1 RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3162 | 功能描述:網(wǎng)絡控制器與處理器 IC Dual ATM/Packet PHYs for DS3/E3/STS-1 RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
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