
TM1300 Data Book
Philips Semiconductors
17-8
PRODUCT SPECIFICATION
17.9
SSI TEST MODES
The SSI unit has two test modes which can be controlled
by setting SSI_CSR.TMS. A remote and a local loop
back testmode are supported (see also Table 17-9).
17.9.1
Remote Loopback
This test mode allows a remote transmitter to test itself,
the intervening transmission media, and its associated
receiver. In this mode, the data received on the
SSI_RxDATA pin is buffered and transmitted on the
SSI_TxDATA pin. The data is not transferred to
SSI_TxDR/TxFIFO and the DSPCPU is never interrupt-
ed. The transmitter is clocked by the SSI_RxCLK pin with
a combinatorial clock delay.
17.9.2
Local Loopback
This test mode allows the DSPCPU to run local checks
of the SSI. Data written to the TxFIFO is serialized and
passed to the receiver via an internal serial connection.
The receiver deserializes the data and passes it to the
RxFIFO register. Interrupts will be generated if enabled.
During local loop back mode, the data on the
SSI_RxDATA pin is ignored and the SSI_TxDATA pin is
tristated. An external CLK must be provided during local
loop back mode or no transmission or reception will oc-
cur.
17.10 MMIO REGISTERS
The MMIO Control and Status registers are shown in
Figure 17-10. The register fields are described in
Table 17-5, Table 17-6, Table 17-7, Table 17-8, and
Table 17-9. To ensure compatibility with future devices,
any undefined MMIO bits should be ignored when read,
and written as ‘0’s.
SSI_CTL (r/w)
0x10 2C00
31
0
MMIO_BASE
offset:
SSI_TXDR (w/o)
0x10 2C10
SSI_RXDR (r/o)
0x10 2C20
SSI_RXACK (w/o)
0x10 2C24
3
7
11
15
19
23
27
TXDATA
RXDATA
SSI_CSR (r/w)
0x10 2C04
WAW
FMS
FSP
MOD
EMS
TDE
RDF
TUE
RIO1
RIO2
0
3
7
11
15
19
31
0
3
7
11
15
19
23
27
FES
CDS
ROE
TXR
RXR
TXE
TSD
RSD
TCP
RCP
RXE
IO1 IO2
WIO1
WIO2
TIE
RIE
FSS
VSS
ILS
WAR
31
23
27
CTUE
SROE
CFES
CCDS
TMS
CDE
CD2
SLP
reset: 0x00f00000
reset: 0x0000f000
RX_ACK
Figure 17-10. SSI MMIO registers.