
1998 Oct 07
94
Philips Semiconductors
Product specification
Pager baseband controller
PCA5007
14 APPENDIX 1: SPECIAL MODES OF THE PCA5007
14.1
Overview
During the rising edge of the external RESOUT signal, the
state of pins ALE, PSEN and EA and P2.X is sampled and
stored. The following decoding (ALE, PSEN and P2) is
used to force the PCA5007 into different operating modes:
[1, 1, X]
→
RUN mode
[0, 1, X]
→
EMUlation modes (for P2 decoding refer to
Metalink documents)
[1, 0, Y]
→
test mode, submode Y
[0, 0, X]
≥
OTP parallel programming mode.
The customer will usually only see the normal RUN mode.
14.2
OTP parallel programming mode
The OTP parallel programming mode is used to access the
on-chip OTP directly from the device pins for programming
and verification. The OTP parallel programming mode and
its initialization are explained in detail in Chapter 15.
14.3
Test modes
The test modes of the PCA5007 are used during the
production test of the circuit. Test modes are not intended
to be used by customers except test mode 2, the
demodulator and clock recovery test mode.
Test mode 2 may be used by customers for Bit Error Rate
(BER) measurements in closed-loop systems.
The following application diagram (see Fig.59) shows an
application, which enters this mode during start-up. After
the test mode is entered the PCA5007 starts execution of
code from the internal program memory. This code must
enable the demodulator and clock recovery in the required
modes. If the microcontroller is requested to make
port I/O, then a frequency of approximately 6 MHz with
V
DD
level needs to be supplied at the TCLK pin.