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| 型號： | DAC1617D1G0HN |
| 廠商： | NXP Semiconductors N.V. |
| 元件分類： | 外設及接口 |
| 英文描述： | Dual 16-bit DAC: up to 1 Gsps; x2, x4 and x8 interpolating |
| 封裝： | DAC1617D1G0HN/C1<SOT813-3 (HVQFN72)|<<http://www.nxp.com/packages/SOT813-3.html<1<Always Pb-free,;DAC1617D1G0HN/C1<SOT813-3 (HVQFN72)|<<http://www.nxp.com/packages/SOT813 |
| 文件頁數(shù)： | 10/66頁 |
| 文件大?。?/td> | 519K |
| 代理商： | DAC1617D1G0HN |
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DAC1617D1G0
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Objective data sheet
Rev. 1.1 — 30 September 2011
10 of 66
NXP Semiconductors
DAC1617D1G0
Dual 16-bit DAC: up to 1 Gsps; x2, x4 and x8 interpolating
E
O
offset error
variation
gain error
variation
integral
non-linearity
differential
non-linearity
D
-
<tbd>
-
ppm/
C
E
G
D
-
<tbd>
-
ppm/
C
INL
D
-
<tbd>
-
LSB
DNL
D
-
<tbd>
-
LSB
Reference voltage output (pin GAPOUT)
V
O(ref)
reference output
voltage
I
O(ref)
reference output
current
V
O(ref)
reference output
voltage variation
Analog auxiliary outputs (pins AUXAP, AUXAN, AUXBP and AUXBN)
I
O(fs)
full-scale output
current
differential outputs
auxiliary DAC B;
differential outputs
V
O(aux)
auxiliary output
voltage
LVDS input timing
f
data
data rate
input;
2 interpolation
input;
4 interpolation
input;
8 interpolation
t
sk(clk-D)
skew time from
clock to data
input
DAC output timing
f
s
sampling rate
t
s
settling time
to
0.5 LSB
Internal PLL timing
f
s
sampling rate
T
amb
= +25
C
I
-
1.22
-
V
1.25 V external voltage
D
-
40
-
A
C
-
<tbd>
-
ppm/
C
auxiliary DAC A;
I
-
3.1
-
mA
I
-
3.1
-
mA
compliance range
C
2.3
-
V
DDA(3V3)
V
C
C
C
C
<tbd>
<tbd>
<tbd>
300
-
-
-
-
312.5
250
125
+300
MHz
MHz
MHz
ps
C
D
-
-
-
20
1000
-
Msps
ns
D
-
-
1000
Msps
Table 5.
V
DDA(1V8)
= 1.8 V; V
DDD(1V8)
= 1.8 V; V
DDA(3V3)
= 3.3 V; Typical values measured at T
amb
= +25
C; R
L
= 50
; I
O(fs)
= 20 mA;
maximum sample rate used; external PLL; no auxiliary DAC; no inverse sinus x/x; no output correction; output load condition
defined in
Figure 22
; output level = 1 V (p-p).
Symbol
Parameter
Conditions
Test
[1]
Characteristics
…continued
Min
Typ
Max
Unit
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