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參數(shù)資料
| 型號： | SN54LVT8980JT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, CDIP24 |
| 封裝： | 0.300 INCH, CERAMIC, DIP-24 |
| 文件頁數(shù)： | 32/36頁 |
| 文件大?。?/td> | 509K |
| 代理商： | SN54LVT8980JT |
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SN54LVT8980, SN74LVT8980
EMBEDDED TEST-BUS CONTROLLERS
IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES
SCBS676D – DECEMBER 1996 – REVISED AUGUST 2002
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
application information
In application, the eTBC is used to master a single IEEE Std 1149.1 TAP under the control of a
microprocessor/microcontroller host. A typical implementation is shown in Figure 1.
IEEE
Std 1149.1-
Compliant
Device Chain
(Target)
TRST
RST
STRB
R/W
RDY
A (2–0)
D (7–0)
TDI
TDO
TMS
TCK
’LVT8980
Embedded
Test
Bus
Controller
Microprocessor/
Microcontroller
(Host)
Program/Vector
Memory
(ROM/RAM)
(If/As Required)
OSC
CLKIN
TOE
CS
GND
Figure 1. eTBC Application
All signals required to master IEEE Std 1149.1-compliant devices – TCK, TMS, TDO, TDI – are
sourced/received by the eTBC. The eTBC also can source the optional TRST signal. Additionally, the eTBC
implements high-drive output buffers, allowing it to interface directly to on- or off-board targets without need for
buffering or other additional logic.
The eTBC’s generic host interface allows it to act as a simple 8-bit memory- or I/O-mapped peripheral. As shown
in Figure 1, for many choices of host microprocessor/microcontroller, this interface can be accomplished without
additional logic. While the eTBC requires a clock input (CLKIN), in many cases it can be driven from the same
source that provides a clock signal to the host.
Thus, in combination with the host microprocessor/microcontroller, the eTBC can be used to implement a
two-chip embedded test-control function supporting board- and system-level built-in test, based on structured
IEEE Std 1149.1 test access. In some cases, for additional program and/or test vector storage, an external
ROM/RAM may be required.
By use of the eTBC in such an embedded test control function, the host microprocessor/microcontroller is freed
from the burden of generating the TAP-state sequences, serializing the outgoing bit stream, and deserializing
the incoming bit stream. All such tasks are implemented in the eTBC, allowing the host to operate at full 8-bit
parallel efficiency, host software to operate at the level of discrete scan operations versus the level of TAP
manipulation, and test throughput to be maximized. The eTBC’s full suite of data-scan and instruction-scan
commands ensure that the host software operates efficiently.
Host efficiency and flexibility also is maximized through the eTBC’s fully visible status and implementation of
the ready output (RDY). RDY goes inactive during a read or write access if the host-requested access cannot
be performed immediately. Thus, it can be used to insert hold or wait states back to the host. When the condition
blocking the access clears, the requested access completes. Additionally, all conditions that can cause such
a blocking condition are continuously updated in the eTBC status and command registers. Thus, the host
software can poll the eTBC status rather than implement RDY in hardware.
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