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參數(shù)資料
| 型號(hào)： | KBE00S009M-D411 |
| 廠商： | SAMSUNG SEMICONDUCTOR CO. LTD. |
| 英文描述： | 1Gb NAND x 2 + 256Mb Mobile SDRAM x 2 |
| 中文描述： | 1Gb的NAND × 2 256Mb的移動(dòng)SDRAM × 2 |
| 文件頁(yè)數(shù)： | 16/86頁(yè) |
| 文件大?。?/td> | 1898K |
| 代理商： | KBE00S009M-D411 |
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MCP MEMORY
16
KBE00S009M-D411
Revision 1.0
May 2005
NAND Flash Technical Notes
(Continued)
Error in write or read operation
Within its life time, the additional invalid blocks may develop with NAND Flash memory. Refer to the qualification report for the actual
data.The following possible failure modes should be considered to implement a highly reliable system. In the case of status read
failure after erase or program, block replacement should be done. Because program status fail during a page program does not
affect the data of the other pages in the same block, block replacement can be executed with a page-sized buffer by finding an
erased empty block and reprogramming the current target data and copying the rest of the replaced block. In case of Read, ECC
must be employed. To improve the efficiency of memory space, it is recommended that the read or verification failure due to single bit
error be reclaimed by ECC without any block replacement. The said additional block failure rate does not include those reclaimed
blocks.
Program Flow Chart
Start
I/O 6 = 1
or R/B = 1
I/O 0 = 0
No
*
Write 80h
Write Address
Write Data
Write 10h
Read Status Register
Program Completed
Program Error
Yes
No
Yes
: If program operation results in an error, map out
the block including the page in error and copy the
target data to another block.
*
Failure Mode
Detection and Countermeasure sequence
Write
Erase Failure
Status Read after Erase --> Block Replacement
Program Failure
Status Read after Program --> Block Replacement
Read
Single Bit Failure
Verify ECC -> ECC Correction
ECC
: Error Correcting Code --> Hamming Code etc.
Example) 1bit correction & 2bits detection
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