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34
Altera Corporation
FLEX 8000 Programmable Logic Device Family Data Sheet
Notes to tables:
(1)
Internal timing parameters cannot be measured explicitly. They are worst-case delays based on testable and
external parameters specified by Altera. Internal timing parameters should be used for estimating device
performance. Post-compilation timing simulation or timing analysis is required to determine actual worst-case
performance.
(2)
(3)
For the tOD3 and tZX3 parameters, VCCIO = 3.3 V or 5.0 V.
(4)
The tROW and tDIN_D delays are worst-case values for typical applications. Post-compilation timing simulation or
timing analysis is required to determine actual worst-case performance.
(5)
External reference timing characteristics are factory-tested, worst-case values specified by Altera. A representative
subset of signal paths is tested to approximate typical device applications.
(6)
For more information on test conditions, see Application Note 76 (Understanding FLEX 8000 Timing) in this data book.
(7)
This parameter is a guideline that is sample-tested only and is based on extensive device characterization. This
parameter applies to global and non-global clocking, and for LE and I/O element registers.
The FLEX 8000 timing model shows the delays for various paths and
functions in the circuit. See
Figure 19. This model contains three distinct
parts: the LE; the IOE; and the interconnect, including the row and column
FastTrack Interconnect, LAB local interconnect, and carry and cascade
interconnect paths. Each parameter shown in
Figure 19 is expressed as a
worst-case value in the “Timing Parameters” tables in this data sheet.
Hand-calculations that use the FLEX 8000 timing model and these timing
parameters can be used to estimate FLEX 8000 device performance.
Timing simulation or timing analysis after compilation is required to
determine the final worst-case performance.
Table 12 summarizes the
Table 12. FLEX 8000 Timing Model Interconnect Paths
Source
Destination
Total Delay
LE-Out
LE in same LAB
tLOCAL
LE-Out
LE in same row, different LAB
tROW + tLOCAL
LE-Out
LE in different row
tCOL + tROW + tLOCAL
LE-Out
IOE on column
tCOL
LE-Out
IOE on row
tROW
IOE on row
LE in same row
tROW + tLOCAL
IOE on column
Any LE
tCOL + tROW + tLOCAL