
Altera Corporation
27
FLEX 8000 Programmable Logic Device Family Data Sheet
FLEX
8000
3
Figure 15. FLEX 8000 AC Test Conditions
Operating
Conditions
The following tables provide information on absolute maximum ratings,
recommended operating conditions, operating conditions, and
capacitance for 5.0-V and 3.3-V FLEX 8000 devices.
FLEX 8000 5.0-V Device Absolute Maximum Ratings
FLEX 8000 5.0-V Device Recommended Operating Conditions
VCC
to Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
464
(703
)
Device
Output
250
(8.06 K
)
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions.
Large-amplitude, fast-ground-current
transients normally occur as the device
outputs discharge the load capacitances.
When these transients ow through the
parasitic inductance between the device
ground pin and the test system ground,
signicant reductions in observable noise
immunity can result. Numbers in
Symbol
Parameter
Conditions
Min
Max
Unit
VCC
Supply voltage
With respect to ground,
–2.0
7.0
V
VI
DC input voltage
–2.0
7.0
V
IOUT
DC output current, per pin
–25
25
mA
TSTG
Storage temperature
No bias
–65
150
° C
TAMB
Ambient temperature
Under bias
–65
135
° C
TJ
Junction temperature
Ceramic packages, under bias
150
° C
PQFP and RQFP, under bias
135
° C
Symbol
Parameter
Conditions
Min
Max
Unit
VCCINT
Supply voltage for internal logic and
input buffers
4.75 (4.50)
5.25 (5.50)
V
VCCIO
Supply voltage for output buffers,
5.0-V operation
4.75 (4.50)
5.25 (5.50)
V
Supply voltage for output buffers,
3.3-V operation
3.00 (3.00)
3.60 (3.60)
V
VI
Input voltage
0
VCCINT
V
VO
Output voltage
0
VCCIO
V
TA
Operating temperature
For commercial use
0
70
° C
For industrial use
–40
85
° C
tR
Input rise time
40
ns
tF
Input fall time
40
ns