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參數(shù)資料
| 型號： | ADUC832BSZ-REEL |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 24/92頁 |
| 文件大小： | 0K |
| 描述： | IC MCU 62K FLASH ADC/DAC 52MQFP |
| 標準包裝： | 800 |
| 系列： | MicroConverter® ADuC8xx |
| 核心處理器： | 8052 |
| 芯體尺寸： | 8-位 |
| 速度： | 16MHz |
| 連通性： | EBI/EMI，I²C，SPI，UART/USART |
| 外圍設(shè)備： | PSM，溫度傳感器，WDT |
| 輸入/輸出數(shù)： | 34 |
| 程序存儲器容量： | 62KB（62K x 8） |
| 程序存儲器類型： | 閃存 |
| EEPROM 大?。?/td> | 4K x 8 |
| RAM 容量： | 2.25K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 2.7 V ~ 5.5 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 8x12b，D/A 2x12b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 125°C |
| 封裝/外殼： | 52-QFP |
| 包裝： | 帶卷 (TR) |
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ADuC832
Data Sheet
Rev. B | Page 30 of 92
EXPLANATION OF TYPICAL PERFORMANCE PLOTS
The plots presented in the Typical Performance Characteristics
section illustrate typical performance of the ADuC832 under
various operating conditions.
Figure 16 and Figure 17 show typical ADC integral nonlinearity
(INL) errors from ADC Code 0 to Code 4095 at 5 V and 3 V
supplies, respectively. The ADC is using its internal reference
(2.5 V) and operating at a sampling rate of 152 kHz, and the
typically worst-case errors in both plots are slightly less than
0.3 LSBs.
Figure 18 and Figure 19 show the variation in worst-case
positive (WCP) INL and worst-case negative (WCN) INL vs.
external reference input voltage.
Figure 20 and Figure 21 show typical ADC differential nonlinear-
ity (DNL) errors from ADC Code 0 to Code 4095 at 5 V and
3 V supplies, respectively. The ADC is using its internal refer-
ence (2.5 V) and operating at a sampling rate of 152 kHz, and
the typically worst-case errors in both plots is slightly less than
0.2 LSBs.
Figure 22 and Figure 23 show the variation in worst-case
positive (WCP) DNL and worst-case negative (WCN) DNL
vs. external reference input voltage.
Figure 24 shows a histogram plot of 10,000 ADC conversion
results on a dc input with VDD = 5 V. The plot illustrates an
excellent code distribution pointing to the low noise
performance of the on-chip precision ADC.
Figure 25 shows a histogram plot of 10,000 ADC conversion
results on a dc input for VDD = 3 V. The plot again illustrates a
very tight code distribution of 1 LSB with the majority of codes
appearing in one output pin.
Figure 26 and Figure 27 show typical FFT plots for the ADuC832.
These plots were generated using an external clock input. The
ADC is using its internal reference (2.5 V) sampling a full-scale,
10 kHz sine wave test tone input at a sampling rate of 149.79 kHz.
The resultant FFTs shown at 5 V and 3 V supplies illustrate an
excellent 100 dB noise floor, 71 dB or greater signal-to-noise
ratio (SNR), and THD greater than 80 dB.
Figure 28 and Figure 29 show typical dynamic performance vs.
external reference voltages. Again, excellent ac performance can
be observed in both plots with some roll-off being observed as
VREF falls below 1 V.
Figure 30 shows typical dynamic performance vs. sampling
frequency. SNR levels of 71 dB are obtained across the sampling
range of the ADuC832.
Figure 31 shows the voltage output of the on-chip temperature
sensor vs. temperature. Although the initial voltage output at
25°C can vary from part to part, the resulting slope of 2 mV/°C is
constant across all parts.
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| ADUC834BCPZ | 功能描述:IC MCU 62K FLASH ADC/DAC 56LFCSP RoHS:是 類別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC8xx 標準包裝:250 系列:LPC11Uxx 核心處理器:ARM? Cortex?-M0 芯體尺寸:32-位 速度:50MHz 連通性:I²C，Microwire，SPI，SSI，SSP，UART/USART，USB 外圍設(shè)備:欠壓檢測/復(fù)位，POR，WDT 輸入/輸出數(shù):40 程序存儲器容量:96KB（96K x 8） 程序存儲器類型:閃存 EEPROM 大小:4K x 8 RAM 容量:10K x 8 電壓 - 電源 (Vcc/Vdd):1.8 V ~ 3.6 V 數(shù)據(jù)轉(zhuǎn)換器:A/D 8x10b 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 85°C 封裝/外殼:48-LQFP 包裝:托盤 其它名稱:568-9587 |
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