參數(shù)資料
型號： OR4E4
廠商： Lineage Power
英文描述： Field-Programmable Gate Arrays(現(xiàn)場可編程門陣列)
中文描述： 現(xiàn)場可編程門陣列（現(xiàn)場可編程門陣列）
文件頁數(shù)： 72/132頁
文件大小： 2667K
代理商： OR4E4
72
Lucent Technologies Inc.
Preliminary Data Sheet
August 2000
ORCA Series 4 FPGAs
FPGA Configuration Modes
(continued)
5-4488(F
Figure 46. Daisy-Chain Configuration Schematic
V
DD
EPROM
PROGRAM
D[7:0]
OE
CE
A[17:0]
A[17:0]
D[7:0]
DONE
M2
M1
M0
DONE
HDC
LDC
RCLK
CCLK
DIN
DOUT
DOUT
DIN
CCLK
DONE
DOUT
INIT
INIT
INIT
CCLK
V
V
DD
OR
GND
PRGM
PRGM
M2
M1
M0
PRGM
M2
M1
M0
V
DD
V
DD
HDC
LDC
RCLK
HDC
LDC
RCLK
V
DD
ORCA
SERIES
FPGA
SLAVE 2
ORCA
SERIES
FPGA
MASTER
ORCA
SERIES
FPGA
SLAVE 1
As seen in Figure 46, the INIT pins for all of the FPGAs
are connected together. This is required to guarantee
that powerup and initialization will work correctly. In
general, the DONE pins for all of the FPGAs are also
connected together as shown to guarantee that all of
the FPGAs enter the start-up state simultaneously. This
may not be required, depending upon the start-up
sequence desired.
Daisy-Chaining with Boundary Scan
Multiple FPGAs can be configured through the JTAG
ports by using a daisy-chain of the FPGAs. This daisy-
chaining operation is available upon initial configuration
after powerup, after a power-on reset, after pulling the
program pin to reset the chip, or during a reconfigura-
tion if the EN_JTAG RAM has been set.
All daisy-chained FPGAs are connected in series.
Each FPGA reads and shifts the preamble and length
count in on the positive TCK and out on the negative
TCK edges.
An upstream FPGA that has received the preamble
and length count outputs a high on TDO until it has
received the appropriate number of data frames so that
downstream FPGAs do not receive frame start bit
pairs. After loading and retransmitting the preamble
and length count to a daisy chain of downstream
devices, the lead device loads its configuration data
frames.
The loading of configuration data continues after the
lead device had received its configuration read into TDI
of downstream devices on the positive edge of TCK,
and shifted out TDO on the negative edge of TCK.
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings
can cause permanent damage to the device. These are
absolute stress ratings only. Functional operation of the
device is not implied at these or any other conditions in
excess of those given in the operations sections of this
data sheet. Exposure to absolute maximum ratings for
extended periods can adversely affect device reliability.
The ORCA Series FPGAs include circuitry designed to
protect the chips from damaging substrate injection
currents and to prevent accumulations of static charge.
Nevertheless, conventional precautions should be
observed during storage, handling, and use to avoid
exposure to excessive electrical stress.
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