參數(shù)資料
型號(hào): KBE00F005A
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 512Mb NAND*2 + 256Mb Mobile SDRAM*2
中文描述: 的512Mb的NAND * 2 256Mb的移動(dòng)SDRAM * 2
文件頁(yè)數(shù): 42/87頁(yè)
文件大?。?/td> 1353K
代理商: KBE00F005A
KBE00F005A-D411
MCP MEMORY
June 2005
42
Revision 1.0
READY/BUSY
The device has a R/B output that provides a hardware method of indicating the completion of a page program, erase and random
read completion. The R/B pin is normally high but transitions to low after program or erase command is written to the command regis-
ter or random read is started after address loading. It returns to high when the internal controller has finished the operation. The pin is
an open-drain driver thereby allowing two or more R/B outputs to be Or-tied. Because pull-up resistor value is related to tr(R/B) and
current drain during busy(ibusy) , an appropriate value can be obtained with the following reference chart(Fig 25). Its value can be
determined by the following guidance.
V
CC
R/B
open drain output
Device
GND
Rp
Figure 22. Rp vs tr ,tf & Rp vs ibusy
ibusy
Busy
Ready Vcc
VOH
tf
tr
VOL
C
L
0.4V, V
OH
: Vcc
Q
-0.4V
t
I
Rp(ohm)
Ibusy
tr
@ Vcc = 2.7V, Ta = 25
°
C , C
L
= 30pF
1K
2K
3K
4K
100n
200n
300n
3m
2m
1m
30
tf
60
90
120
2.3
2.3
2.3
2.3
2.3
1.1
0.75
0.55
where I
L
is the sum of the input currents of all devices tied to the R/B pin.
Rp(max) is determined by maximum permissible limit of tr
Rp value guidance
Rp(min, 2.7V part) =
V
CC
(Max.) - V
OL
(Max.)
I
OL
+
Σ
I
L
=
2.5V
3mA
+
Σ
I
L
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