參數(shù)資料
型號(hào): HYB18T512800AF-37
廠商: INFINEON TECHNOLOGIES AG
英文描述: 512-Mbit Double-Data-Rate-Two SDRAM
中文描述: 512兆雙數(shù)據(jù)速率2內(nèi)存
文件頁(yè)數(shù): 84/96頁(yè)
文件大?。?/td> 1571K
代理商: HYB18T512800AF-37
HYB18T512[400/800/160]A[C/F]–[3.7/5]
512-Mbit Double-Data-Rate-Two SDRAM
Reference Loads, Setup & Hold Timing Definition and Slew Rate Derating
Data Sheet
84
Rev. 1.13, 2004-05
09112003-SDM9-IQ3P
8.3
Input and Data Setup and Hold Time
8.3.1
Address and control input setup time (
t
IS
) is referenced
from the input signal crossing at the
V
IH(ac)
level for a
rising signal and
V
IL(ac)
for a falling signal applied to the
device under test. Address and control input hold time
Timing Definition for Input Setup (
t
IS
) and Hold Time (
t
IH
)
(
t
IH
) is referenced from the input signal crossing at the
V
IL(dc)
level for a rising signal and
V
IH(dc)
for a falling
signal applied to the device under test.
.
Figure 68
Input, setup and Hold Time Diagram
8.3.2
1. Data input setup time with differential data strobe
enabled MR[bit10]=0, is referenced from the input
signal crossing at the
V
IH(ac)
level to the differential
data strobe crosspoint for a rising signal, and from
the input signal crossing at the
V
IL(ac)
level to the
differential data strobe crosspoint for a falling signal
applied to the device under test. Input waveform
timing with single-ended data strobe enabled
MR[bit10]=1, is referenced from the input signal
crossing at the
V
IH(ac)
level to the data strobe
crossing
V
REF
for a rising signal, and from the input
signal crossing at the
V
IL(ac)
level to the single-
ended data strobe crossing
V
REF
for a falling signal
applied to the device under test.
Timing Definition for Data Setup (
t
DS
) and Hold Time (
t
DH
)
2. Data input hold time with differential data strobe
enabled MR[bit10]=0, is referenced from the input
signal crossing at the
V
IL(dc)
level to the differential
data strobe crosspoint for a rising signal and
V
IH(dc)
to the differential data strobe crosspoint for a falling
signal applied to the device under test. Input
waveform timing with single-ended data strobe
enabled MR[bit10]=1, is referenced from the input
signal crossing at the
V
IL(dc)
level to the single-
ended data strobe crossing
V
REF
for a rising signal
and
V
IH(dc)
to the single-ended data strobe crossing
V
REF
for a falling signal applied to the device under
test.
V
DDQ
V
IH(ac)
min
V
IH(dc)
min
V
REF
V
IL(dc)
max
V
IL(ac)
max
V
SS
tIS
tIH
tIS
tIH
CK
CK
相關(guān)PDF資料
PDF描述
HYB18T512800AF-5 512-Mbit Double-Data-Rate-Two SDRAM
HYB25D128160CE-5 128 Mbit Double Data Rate SDRAM
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