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參數(shù)資料
| 型號： | BX805573060 |
| 廠商： | INTEL CORP |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 64-BIT, 2400 MHz, MICROPROCESSOR, CBGA775 |
| 封裝： | LGA-775 |
| 文件頁數(shù)： | 14/102頁 |
| 文件大小： | 2428K |
| 代理商： | BX805573060 |
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Dual-Core Intel Xeon Processor 3000 Series Datasheet
19
Electrical Specifications
The TESTHI signals may use individual pull-up resistors or be grouped together as
detailed below. A matched resistor must be used for each group:
TESTHI[1:0]
TESTHI[7:2]
TESTHI8/FC42 – cannot be grouped with other TESTHI signals
TESTHI9/FC43 – cannot be grouped with other TESTHI signals
TESTHI10 – cannot be grouped with other TESTHI signals
TESTHI11 – cannot be grouped with other TESTHI signals
TESTHI12/FC44 – cannot be grouped with other TESTHI signals
TESTHI13 – cannot be grouped with other TESTHI signals
However, utilization of boundary scan test will not be functional if these lands are
connected together. For optimum noise margin, all pull-up resistor values used for
TESTHI[13:0] lands should have a resistance value within ± 20% of the impedance of
the board transmission line traces. For example, if the nominal trace impedance is 50 Ω,
then a value between 40 Ω and 60 Ω should be used.
2.6
Voltage and Current Specification
2.6.1
Absolute Maximum and Minimum Ratings
Table 2-3 specifies absolute maximum and minimum ratings only and lie outside the
functional limits of the processor. Within functional operation limits, functionality and
long-term reliability can be expected.
At conditions outside functional operation condition limits, but within absolute
maximum and minimum ratings, neither functionality nor long-term reliability can be
expected. If a device is returned to conditions within functional operation limits after
having been subjected to conditions outside these limits, but within the absolute
maximum and minimum ratings, the device may be functional, but with its lifetime
degraded depending on exposure to conditions exceeding the functional operation
condition limits.
At conditions exceeding absolute maximum and minimum ratings, neither functionality
nor long-term reliability can be expected. Moreover, if a device is subjected to these
conditions for any length of time then, when returned to conditions within the
functional operating condition limits, it will either not function, or its reliability will be
severely degraded.
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields.
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