參數(shù)資料
型號(hào)： XE8000EV104
廠商： Semtech
文件頁數(shù)： 18/156頁
文件大?。?/td> 0K
描述： EVAL BOARD FOR XE8805AMI028LF
標(biāo)準(zhǔn)包裝： 1
類型： MCU
適用于相關(guān)產(chǎn)品： XE88LC05AMI028
所含物品： 完全組裝的評(píng)估板
Semtech 2006
www.semtech.com
16-28
XE8805/05A
Offset error is defined as the output code error for a zero volt input (ideally, output code = 0). The offset of the ADC
and the PGA1 stage are completely suppressed if NELCONV > 1.
The measured offset drift vs. temperature curves for different PGA gains are depicted in Figure 16-20. The output
offset error, expressed in LSB for 16-bit setting, is normalized to 25°C. Notice that if the ADC is used alone, the
output offset error is below
±1 LSB and has no drift.
NORMALIZED TO 25°C
-0.4
-0.3
-0.2
-0.1
0.0
0.1
0.2
-50
-25
0
25
50
75
100
Temperature [°C]
G
a
in
E
rro
r[
%
o
fF
S
R
]
1
5
20
100
Figure 16-19. Gain error vs. temperature for different PGA gains
NORMALIZED TO 25°C
-40
-20
0
20
40
60
80
100
-50
-25
0
25
50
75
100
Temperature [°C]
O
u
tp
u
t
O
ffs
e
tE
rr
o
r[L
S
B
]
1
5
20
100
Figure 16-20. Offset error vs. temperature for different PGA gains
16.8.6
Power Consumption
Figure 16-21 plots the variation of quiescent current consumption with supply voltage VDD, as well as the
distribution between the 3 PGA stages and the ADC (see Table 16-28). As shown in Figure 16-22, if lower
sampling frequency is used, the quiescent current consumption can be lowered by reducing the bias currents of the
PGAs and the ADC with registers IB_AMP_PGA
[1:0]
and IB_AMP_ADC
[1:0]
. (In Figure 16-22,
IB_AMP_PGA/ADC[1:0]
= '11', '10', '00' for fS = 500, 250, 62.5kHz respectively.)
Quiescent current consumption vs. temperature is depicted in Figure 16-23, showing a relative increase of nearly
40% between -45 and +85°C. Figure 16-24 shows the variation of quiescent current consumption for different
frequency settings of the internal RC oscillator. It can be seen that the quiescent current varies by about 20%
between 100kHz and 2MHz.
Not
Recommended
for
New
Designs
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