參數(shù)資料
型號： TMX470R1A64PN
廠商： Texas Instruments, Inc.
英文描述： 16/32-Bit RISC Flash Microcontroller
中文描述： 16/32位RISC閃存微控制器
文件頁數(shù)： 9/46頁
文件大?。?/td> 381K
代理商： TMX470R1A64PN
www.ti.com
A
TMS470R1A64
16/32-Bit RISC Flash Microcontroller
SPNS099–NOVEMBER 2004
Table 2. Terminal Functions (continued)
TERMINAL
INTERNAL
PULLUP/
PULLDOWN
(3)
TYPE
(1)(2)
DESCRIPTION
NAME
PIN
NUMBER
WATCHDOG/REAL-TIME INTERRUPT (WD/RTI)
Analog watchdog reset. The AWD pin provides a system reset if the WD KEY
is not written in time by the system, providing an external RC network circuit is
connected. If the user is not using AWD, TI recommends that AWD be
connected to ground or pulled down to ground by an external resistor.
IPD
For more details on the external RC network circuit, see the
TMS470R1x
System Module Reference Guide
(literature number SPNU189) and the
application note
Analog Watchdog Resistor, Capacitor and Discharge Interval
Selection Constraints
(literature number SPNA005).
TEST/DEBUG (T/D)
IPD
Test clock. TCK controls the test hardware (JTAG)
Test data in. TDI inputs serial data to the test instruction register, test data
IPU
register, and programmable test address (JTAG).
Test data out. TDO outputs serial data from the test instruction register, test
IPD
data register, identification register, and programmable test address (JTAG).
Test enable. Reserved for internal use only. TI recommends that TEST be
IPD
connected to ground or pulled down to ground by an external resistor.
Serial input for controlling the state of the CPU test access port (TAP)
IPU
controller (JTAG)
Serial input for controlling the second TAP. TI recommends that TMS2 be
IPU
connected to VCCIO or pulled up to VCCIO by an external resistor.
Test hardware reset to TAP1 and TAP2. IEEE Standard 1149-1 (JTAG)
IPD
Boundary-Scan Logic. TI recommends that TRST be pulled down to ground
by an external resistor.
FLASH
Flash test pad 2. For proper operation,FLTP2 must not be connected (no
connect [NC]).
Flash external pump voltage (3.3 V)
AWD
40
3.3-V I/O
TCK
TDI
44
3.3-V I
42
3.3-V I
TDO
43
3.3-V O
TEST
22
3.3-V I
TMS
69
3.3-V I
TMS2
70
3.3-V I
21
TRST
3.3-V I
75
NC
FLTP2
76
3.3-V
PWR
V
CCP
SUPPLY VOLTAGE CORE (1.8 V)
9
32
55
74
1.8-V
PWR
V
CC
Core logic supply voltage
SUPPLY VOLTAGE DIGITAL I/O (3.3 V)
12
47
3.3-V
PWR
V
CCIO
Digital I/O supply voltage
SUPPLY GROUND CORE
6
31
54
71
73
V
SS
GND
Core supply ground reference
SUPPLY GROUND DIGITAL I/O
11
46
V
SSIO
GND
Digital I/O supply ground reference
9
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