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參數(shù)資料
| 型號： | ST7DALI |
| 廠商： | 意法半導體 |
| 元件分類： | ADC |
| 英文描述： | 8-BIT MCU WITH SINGLE VOLTAGE FLASH MEMORY, DATA EEPROM, ADC, TIMERS, SPI, DALI |
| 中文描述： | 8位單電壓閃存存儲器，數(shù)據(jù)EEPROM，模數(shù)轉換器，定時器，SPI和大理微控制器 |
| 文件頁數(shù)： | 138/141頁 |
| 文件大?。?/td> | 2175K |
| 代理商： | ST7DALI |
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ST7DALI
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16 IMPORTANT NOTES
16.1 EXECUTION OF BTJX INSTRUCTION
When testing the address $FF with the "BTJT" or
"BTJF" instructions, the CPU may perform an in-
correct operation when the relative jump is nega-
tive and performs an address page change.
To avoid this issue, including when using a C com-
piler, it is recommended to never use address
$00FF as a variable (using the linker parameter for
example).
16.2 ADC CONVERSION SPURIOUS RESULTS
Spurious conversions occur with a rate lower than
50 per million. Such conversions happen when the
measured voltage is just between 2 consecutive
digital values.
Workaround
A software filter should be implemented to remove
erratic conversion results whenever they may
cause unwanted consequences.
16.3 A/ D CONVERTER ACCURACY FOR FIRST
CONVERSION
When the ADC is enabled after being powered
down (for example when waking up from HALT,
ACTIVE-HALT or setting the ADON bit in the AD-
CCSR register), the first conversion (8-bit or 10-
bit) accuracy does not meet the accuracy specified
in the datasheet.
Workaround
In order to have the accuracy specified in the da-
tasheet, the first conversion after a ADC switch-on
has to be ignored.
16.4 NEGATIVE INJECTION IMPACT ON ADC
ACCURACY
Injecting a negative current on an analog input
pins significantly reduces the accuracy of the AD
Converter. Whenever necessary, the negative in-
jection should be prevented by the addition of a
Schottky diode between the concerned I/Os and
ground.
Injecting a negative current on digital input pins
degrades ADC accuracy especially if performed
on a pin close to ADC channel in use.
16.5
OUTSIDE INTERRUPT ROUTINE
CLEARING
ACTIVE
INTERRUPTS
When an active interrupt request occurs at the
same time as the related flag or interrupt mask is
being cleared, the CC register may be corrupted.
Concurrent interrupt context
The symptom does not occur when the interrupts
are handled normally, i.e. when:
- The interrupt request is cleared (flag reset or in-
terrupt mask) within its own interrupt routine
- The interrupt request is cleared (flag reset or in-
terrupt mask) within any interrupt routine
- The interrupt request is cleared (flag reset or in-
terrupt mask) in any part of the code while this in-
terrupt is disabled
If these conditions are not met, the symptom can
be avoided by implementing the following se-
quence:
Perform SIM and RIM operation before and after
resetting an active interrupt request
Ex:
SIM
reset flag or interrupt mask
RIM
16.6 USING PB4 AS EXTERNAL INTERRUPT
PB4 cannot be used as an external interrupt in
HALT mode because the port pin PB4 is not active
in this mode.
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