
Preliminary Data Sheet
August 2000
Lucent Technologies Inc.
43
ORCA Series 4 FPGAs
Special Function Blocks
(continued)
5-5768(F)
Figure 27. ORCA Series Boundary-Scan Circuitry Functional Diagram
TAP
CONTROLLER
TMS
TCK
BOUNDARY-SCAN REGISTER
USER CODE REGISTERS
BYPASS REGISTER
DATA
MUX
INSTRUCTION DECODER
INSTRUCTION REGISTER
M
U
X
RESET
CLOCK IR
SHIFT-IR
UPDATE-IR
PUR
TDO
SELECT
ENABLE
RESET
CLOCK DR
SHIFT-DR
UPDATE-DR
TDI
DATA REGISTERS
PSR1/PSR2/PSR3 REGISTERS (PLCs)
CONFIGURATION REGISTER
(RAM_R, RAM_W)
PRGM
I/O BUFFERS
V
DD
V
DD
V
DD
V
DD
IDCODE REGISTER
ORCASeries TAP Controller (TAPC)
The ORCA Series TAP controller (TAPC) is a 1149
compatible test access port controller. The 16 JTAG
state assignments from the IEEE1149 specification
are used. The TAPC is controlled by TCK and TMS.
The TAPC states are used for loading the IR to allow
three basic functions in testing: providing test stimuli
(Update-DR), providing test execution (Run-Test/Idle),
and obtaining test responses (Capture-DR). The TAPC
allows the test host to shift in and out both instructions
and test data/results. The inputs and outputs of the
TAPC are provided in the table below. The outputs are
primarily the control signals to the instruction register
and the data register.
Table 24. TAP Controller Input/Outputs
Symbol
TMS
TCK
PUR
PRGM
TRESET
Select
Enable
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Update-DR
Update-IR
I/O
I
I
I
I
O
O
O
O
O
O
O
O
O
Function
Test Mode Select
Test Clock
Powerup Reset
BSCAN Reset
Test Logic Reset
Select IR (High); Select-DR (Low)
Test Data Out Enable
Capture/Parallel Load-DR
Capture/Parallel Load-IR
Shift Data Register
Shift Instruction Register
Update/Parallel Load-DR
Update/Parallel Load-IR