參數(shù)資料
型號: MQ80C154-16P883
廠商: TEMIC SEMICONDUCTORS
元件分類: 微控制器/微處理器
英文描述: 8-BIT, 16 MHz, MICROCONTROLLER, CQFP44
文件頁數(shù): 139/142頁
文件大?。?/td> 61013K
代理商: MQ80C154-16P883
223
ATmega165A/PA/325A/PA/3250A/PA/645A/P/6450A/P [DATASHEET]
8285E–AVR–02/2013
25.5.5
Scanning the ADC
Figure 25-9 on page 223 shows a block diagram of the ADC with all relevant control and observe signals. The
Boundary-scan cell from Figure 25-5 on page 220 is attached to each of these signals. The ADC need not be used
for pure connectivity testing, since all analog inputs are shared with a digital port pin as well.
Figure 25-9. Analog to Digital Converter.
The signals are described briefly in Table 25-3 on page 223.
10-bit DAC
+
-
AREF
PRECH
DACOUT
COMP
MUXEN_7
ADC_7
MUXEN_6
ADC_6
MUXEN_5
ADC_5
MUXEN_4
ADC_4
MUXEN_3
ADC_3
MUXEN_2
ADC_2
MUXEN_1
ADC_1
MUXEN_0
ADC_0
NEGSEL_2
ADC_2
NEGSEL_1
ADC_1
NEGSEL_0
ADC_0
EXTCH
+
-
1x
ST
ACLK
AMPEN
1.11V
ref
IREFEN
AREF
VCCREN
DAC_9..0
ADCEN
HOLD
PRECH
GNDEN
PASSEN
COMP
SCTEST
ADCBGEN
To Comparator
1.22V
ref
ACTEN
AREF
Table 25-3.
Boundary-scan Signals for the ADC
Signal name
Direction as seen
from the ADC
Description
Recommended
Input when not
in use
Output values when
recommended inputs are used,
and CPU is not using the ADC
COMP
Output
Comparator Output
0
ACLK
Input
Clock signal to differential amplifier
implemented as Switch-cap filters
00
ACTEN
Input
Enable path from differential
amplifier to the comparator
00
ADCBGEN
Input
Enable Band-gap reference as
negative input to comparator
00
ADCEN
Input
Power-on signal to the ADC
0
AMPEN
Input
Power-on signal to the differential
amplifier
00
DAC_9
Input
Bit 9 of digital value to DAC
1
DAC_8
Input
Bit 8 of digital value to DAC
0
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