參數(shù)資料
型號: DS33Z11+
廠商: Maxim Integrated Products
文件頁數(shù): 72/172頁
文件大小: 0K
描述: IC MAPPER ETHERNET 169-CSBGA
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 7
應(yīng)用: 數(shù)據(jù)傳輸
接口: SPI/并聯(lián)
電源電壓: 1.8V, 3.3V
封裝/外殼: 169-LBGA,CSPBGA
供應(yīng)商設(shè)備封裝: 169-CSBGA(14x14)
包裝: 托盤
安裝類型: 表面貼裝
產(chǎn)品目錄頁面: 1429 (CN2011-ZH PDF)
DS33Z11 Ethernet Mapper
163 of 172
12 JTAG INFORMATION
The device supports the standard instruction codes SAMPLE:PRELOAD, BYPASS, and EXTEST. Optional public
instructions included are HIGHZ, CLAMP, and IDCODE. See Table 12-1. The DS33Z11 contains the following as
required by IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture.
Test Access Port (TAP)
TAP Controller
Instruction Register
Bypass Register
Boundary Scan Register
Device Identification Register
The Test Access Port has the necessary interface pins:
JTRST, JTCLK, JTMS, JTDI, and JTDO. See the pin
descriptions for details. Refer to IEEE 1149.1-1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994 for details
about the Boundary Scan Architecture and the Test Access Port.
Figure 12-1 JTAG Functional Block Diagram
12.1 JTAG TAP Controller State Machine Description
This section covers the details on the operation of the Test Access Port (TAP) Controller State Machine. The TAP
controller is a finite state machine that responds to the logic level at JTMS on the rising edge of JTCLK.
Boundary Scan
Register
Identification
Register
Bypas
Register
Instruction
Register
Test Access Port
Controller
Mux
Select
Tri-State
JTDI
10K
JTMS
10K
JTCLK
JTRST
10K
JTDO
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