參數(shù)資料
型號: CLRC632
廠商: NXP Semiconductors N.V.
英文描述: Multiple Protocol Contactless Reader IC
中文描述: 多協(xié)議非接觸式讀卡器IC
文件頁數(shù): 146/163頁
文件大?。?/td> 948K
代理商: CLRC632
Philips Semiconductors
Product Specification Rev. 3.0; May 2003
Multiple Protocol Contactless Reader IC
CL RC632
146
Confidential
21.4 Digital Test-Signals
Digital test signals may be routed to pin MFOUT by setting bit
SignalToMFOUT
to 1. A digital test signal may
be selected via the register bits
TestDigiSignalSel
in Register
TestDigiSelect
.
The signals selected by a certain
TestDigiSignalSel
setting is shown in the table below:
TestDigiSignalSel
Signal Name
Description
F4
hex
s_data
Data received from the card.
E4
hex
s_valid
Shows with 1, that the signals s_data and s_coll are valid.
D4
hex
s_coll
Shows with 1, that a collision has been detected in the current bit.
C4
hex
s_clock
Internal serial clock: during transmission, this is the coder-clock and during
reception this is the receiver clock.
B5
hex
rd_sync
Internal synchronised read signal (derived from the parallel μ-Processor
interface).
A5
hex
wr_sync
Internal synchronised write signal (derived from the parallel μ-Processor
interface).
96
hex
int_clock
Internal 13.56 MHz clock.
83
hex
BPSK_out
BPSK signal output
E2
hex
BPSK_sig
BPSK signal’s amplitude detected
00
hex
no test signal
output as defined by
MFOUTSelect
are routed to pin MFOUT.
Table 21-3: Digital Test Signal Selection
If no test signals are used, the value for the
TestDigiSelect-Register
shall be 00
hex
.
Note: All other values of
TestDigiSignalSel
are for production test purposes only.
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