參數(shù)資料
型號(hào)： ADUC7039BCP6Z-RL
廠商： Analog Devices Inc
文件頁數(shù)： 4/92頁
文件大?。?/td> 0K
描述： IC MCU ARM7 BATT SENSER 32LFCSP
標(biāo)準(zhǔn)包裝： 2,500
系列： MicroConverter® ADuC7xxx
核心處理器： ARM7
芯體尺寸： 16/32-位
速度： 20.48MHz
連通性： LIN，SPI
外圍設(shè)備： POR，溫度傳感器，WDT
輸入/輸出數(shù)： 6
程序存儲(chǔ)器容量： 64KB（32K x 16）
程序存儲(chǔ)器類型： 閃存
RAM 容量： 1K x 32
電壓 - 電源 (Vcc/Vdd)： 3.5 V ~ 18 V
數(shù)據(jù)轉(zhuǎn)換器： A/D 2x16b
振蕩器型： 內(nèi)部
工作溫度： -40°C ~ 115°C
封裝/外殼： 32-VFQFN 裸露焊盤，CSP
包裝： 帶卷 (TR)
ADuC7039
Data Sheet
Rev. D | Page 12 of 92
TERMINOLOGY
Conversion Rate
The conversion rate specifies the rate at which an output result
is available from the ADC, after the ADC has settled.
The sigma-delta (Σ-Δ) conversion techniques used on this part
mean that while the ADC front-end signal is oversampled at a
relatively high sample rate, a subsequent digital filter is used to
decimate the output giving a valid 16-bit data conversion result
at output rates from 1 Hz to 1 kHz.
Note that when software switches from one input to another
(on the same ADC), the digital filter must first be cleared and
then allowed to average a new result. Depending on the con-
figuration of the ADC and the type of filter, this can require
multiple conversion cycles.
Integral Nonlinearity (INL)
INL is the maximum deviation of any code from a straight
line passing through the endpoints of the transfer function.
The endpoints of the transfer function are zero scale, a point
LSB below the first code transition, and full scale, a point
LSB above the last code transition (111 . . . 110 to 111 . . . 111).
The error is expressed as a percentage of full scale.
No Missing Codes
No missing codes is a measure of the differential nonlinearity
of the ADC. The error is expressed in bits and specifies the
number of codes (ADC results) as 2N bits, where N = no
missing codes, guaranteed to occur through the full ADC
input range.
Offset Error
Offset error is the deviation of the first code transition ADC
input voltage from the ideal first code transition.
Offset Error Drift
Offset error drift is the variation in absolute offset error with
respect to temperature. This error is expressed as LSB/°C
or nV/°C.
Gain Error
Gain error is a measure of the span error of the ADC. It is a
measure of the difference between the measured and the ideal
span between any two points in the transfer function.
Output Noise
The output noise is specified as the standard deviation (or 1 × Σ)
of ADC output codes distribution collected when the ADC
input voltage is at a dc voltage. It is expressed as V or nV rms.
The output, or rms noise, can be used to calculate the effective
resolution of the ADC as defined by the following equation:
Effective Resolution = log2(Full-Scale Range/rms Noise) bits
The peak-to-peak noise is defined as the deviation of codes that
fall within 6.6 × Σ of the distribution of ADC output codes col-
lected when the ADC input voltage is at dc. The peak-to-peak
noise is, therefore, calculated as 6.6 × the rms noise.
The peak-to-peak noise can be used to calculate the ADC
(noise free, code) resolution for which there is no code flicker
within a 6.6 × Σ limit as defined by the following equation:
Noise Free Code Resolution = log2(Full-Scale Range/Peak-
to-Peak Noise) bits
Table 4. Data Sheet Acronyms
Acronym
Definition
ADC
Analog-to-digital converter
ARM
Advanced RISC machine
JTAG
Joint test action group
LIN
Local interconnect network
LSB
Least significant byte/bit
MCU
Microcontroller unit
MMR
Memory mapped register
MSB
Most significant byte/bit
OTP
One time programmable
PID
Protected identifier
POR
Power-on reset
rms
Root mean square
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