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參數(shù)資料
| 型號(hào)： | SN54ABT18502HVR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 |
| 封裝： | CERAMIC, QFP-68 |
| 文件頁數(shù)： | 26/30頁 |
| 文件大?。?/td> | 451K |
| 代理商： | SN54ABT18502HVR |
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SN54ABT18502, SN74ABT18502
SCAN TEST DEVICES WITH
18-BIT REGISTERED BUS TRANSCEIVERS
SCBS109B – AUGUST 1992 – REVISED JUNE 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
5
Terminal Functions
PIN NAME
DESCRIPTION
GND
Ground
TCK
Test clock. One of four pins required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
the test clock. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four pins required by IEEE Standard 1149.1-1990. The test data input is the serial input for shifting
data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left
unconnected.
TDO
Test data output. One of four pins required by IEEE Standard 1149.1-1990. The test data output is the serial output for
shifting data through the instruction register or selected data register.
TMS
Test mode select. One of four pins required by IEEE Standard 1149.1-1990. The test mode select input directs the device
through its test access port (TAP) controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
1A1–1A9,
2A1– 2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9,
2B1– 2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1CLKAB, 1CLKBA,
2CLKAB, 2CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
1LEAB, 1LEBA,
2LEAB, 2LEBA
Normal-function latch enables. See function table for normal-mode logic.
1OEAB, 1OEBA,
2OEAB, 2OEBA
Normal-function output enables. See function table for normal-mode logic.
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