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參數(shù)資料
| 型號： | SN54ABT18502HVR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 |
| 封裝： | CERAMIC, QFP-68 |
| 文件頁數(shù)： | 23/30頁 |
| 文件大?。?/td> | 451K |
| 代理商： | SN54ABT18502HVR |
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SN54ABT18502, SN74ABT18502
SCAN TEST DEVICES WITH
18-BIT REGISTERED BUS TRANSCEIVERS
SCBS109B – AUGUST 1992 – REVISED JUNE 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
3
description (continued)
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform
other testing functions such as parallel signature analysis on data inputs and pseudo-random pattern generation
from data outputs. All testing and scan operations are synchronized to the TAP interface.
Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each
I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT
instruction is also included to ease the testing of memories and other circuits where a binary count addressing
scheme is useful.
The SN54ABT18502 is characterized for operation over the full military temperature range of – 55
°C to 125°C.
The SN74ABT18502 is characterized for operation from – 40
°C to 85°C.
FUNCTION TABLE
(normal mode, each register)
INPUTS
OUTPUT
OEAB
LEAB
CLKAB
A
B
L
X
B0
L
↑
LL
L
↑
HH
L
HX
L
HX
H
X
Z
A-to-B data flow is shown. B-to-A data flow is similar
but uses OEBA, LEBA, and CLKBA.
Output level before the indicated steady-state input
conditions were established.
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