
Philips Semiconductors
Product specification
SC28L92
3.3V–5.0V Dual Universal Asynchronous
Receiver/Transmitter (DUART)
2000 Jan 21
10
ABSOLUTE MAXIMUM RATINGS
1
SYMBOL
PARAMETER
RATING
UNIT
°
C
°
C
V
T
amb
T
stg
V
CC
V
S
P
D
P
D
Operating ambient temperature range
2
Note 4
Storage temperature range
Voltage from V
CC
to GND
3
Voltage from any pin to GND
3
–65 to +150
–0.5 to +7.0
–0.5 to V
CC
+0.5
2.4
V
Package power dissipation (PLCC44)
W
Package power dissipation (PQFP44)
1.78
W
Derating factor above 25 C (PLCC44)
19
mW/
°
C
mW/
°
C
Derating factor above 25 C (PQFP44)
14
NOTES:
1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other condition above those indicated in the operation section of this specification is not
implied.
2. For operating at elevated temperatures, the device must be derated based on +150
°
C maximum junction temperature.
3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima.
4. Parameters are valid over specified temperature and voltage range.
DC ELECTRICAL CHARACTERISTICS
1, 2, 3
V
CC
= 5V
±
10%, T
amb
= –40
°
C to +85
°
C, unless otherwise specified.
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Min
Typ
Max
UNIT
V
IL
V
IH
V
IH
V
OL
Input low voltage
0.8
V
Input high voltage (except X1/CLK)
2.4
1.5
V
Input high voltage (X1/CLK)
0.8*V
CC
2.4
V
Output low voltage
I
OL
= 2.4mA
I
OH
= -400
μ
A
V
IN
= 0 to V
CC
V
IN
= 0
V
IN
= V
CC
0.2
0.4
V
V
OH
Output high voltage (except OD outputs)
4
V
CC
-0.5
V
I
IX1PD
I
ILX1
I
IHX1
X1/CLK input current - power down
0.5
0.05
0.5
μ
A
X1/CLK input low current - operating
–130
0
μ
A
μ
A
X1/CLK input high current - operating
0
130
Input leakage current:
I
I
All except input port pins
Input port pins
5
V
IN
= 0 to V
CC
V
IN
= 0 to V
CC
V
IN
= V
CC
V
IN
= 0V
V
IN
= 0
V
IN
= V
CC
–0.5
0.05
+0.5
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
–8
0.05
+0.5
I
OZH
I
OZL
I
ODL
I
ODH
Output off current high, 3-State data bus
0.5
Output off current low, 3-State data bus
–0.5
Open-drain output low current in off-state
–0.5
Open-drain output high current in off-state
Power supply current
6
Operating mode
0.5
I
CC
CMOS input levels
7
≤
1
25
mA
Power down mode
CMOS input levels
5
A
NOTES:
1. Parameters are valid over specified temperature and voltage range.
2. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4V and 3.0V with a transition time of
5ns maximum. For X1/CLK, this swing is between 0.4V and 0.8*V
CC
. All time measurements are referenced at input voltages of 0.8V and
2.0V and output voltages of 0.8V and 2.0V, as appropriate.
3. Typical values are at +25
°
C, typical supply voltages, and typical processing parameters.
4. Test conditions for outputs: C
L
= 125pF, except open drain outputs. Test conditions for open drain outputs: C
L
= 125pF,
constant current source = 2.6mA.
5. Input port pins have active pull-up transistors that will source a typical 2
μ
A from V
CC
when the input pins are at V
SS
.
Input port pins at V
CC
source 0.0
μ
A.
6. All outputs are disconnected. Inputs are switching between CMOS levels of V
CC
-0.2V and V
SS
+ 0.2V.