參數(shù)資料
型號(hào)： HD74AC
廠商： Hitachi,Ltd.
英文描述： HD74AC Series Common Information
中文描述： HD74AC系列通用信息
文件頁(yè)數(shù)： 52/52頁(yè)
文件大小： 220K
代理商： HD74AC
Design Considerations
51
flowing back down the line equal to the current flowing in the line prior to the opening of the switch. This
current wave will propagate down the line where it will encounter the high impedance tester load. This will
cause the wave to be reflected back down the line toward the DUT. The current wave will continue to
reflect in the transmission line until it reaches the voltage applied to the tester load. At this point, the
current source impedance decreases and it will dissipate the current. A typical waveshape on a modern
ATE is depicted in figure 27.
V
OUTPUT
OE
Time (ns)
1
2
3
4
5
6
7
8
9 10 11 12
0
1
2
3
4
5
Figure 27 Typical ATE 3-State Waveform
Transmission line theory states that the voltage level of this current wave is equal to the current in the line
times the impedance of the line. With typical currents as low as 5 mA and impedances of 50 to 60
, this
voltage step can be as minimal as 250 mV. If the comparator was programmed to the 10% point, it would
be looking for a step of 550 mV at 5.5 V V
CC
. Three reflections of the current pulse would be required
before the comparator would detect the level. It is this added delay time caused by the transmission line
environment of the ATE that may cause parts to fail customers’ incoming tests, even though the device
meets specifications. Figure 28 graphically shows this stepout.
V
Time (ns)
1
2
3
4
5
6
B
A
C
7
8
9 10 11 12
0
1
2
3
4
5
Figure 28 Measurement Stepout
Point A represents the typical 50% measurement point on tester driven waveforms. Point B represents the
point at which the delay time would be measured on a bench test fixture. Point C represents where the
delay time could be measured on ATE fixtures. The delay time measured on the ATE fixture can vary
from the bench measured delay time to some greater value, depending upon the voltage level that the tester
is set. If the voltage level of the tester is close to voltage levels of the plateaus, the results may become
non-repeatable.
相關(guān)PDF資料
PDF描述
HD74ALVC162244 16-bit Buffer / Driver with 3-state Outputs(帶三態(tài)輸出的16位緩沖器/驅(qū)動(dòng)器)
HD74ALVC162334 16-bit Universal Bus Driver with 3-state Outputs(帶三態(tài)輸出的16位通用總線驅(qū)動(dòng)器)
HD74ALVC16244 16-bit Buffer / Driver with 3-state Outputs(帶三態(tài)輸出的16位緩沖器/驅(qū)動(dòng)器)
HD74ALVC162831 1-bit to 4-bit Address Register / Driver with 3-state Outputs(三態(tài)輸出的1位-4位地址寄存器/驅(qū)動(dòng)器)
HD74ALVC162834A 1-Of-8 Data Selectors/Multiplexers 16-CDIP -55 to 125
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
HD74AC00 制造商:HITACHI 制造商全稱:Hitachi Semiconductor 功能描述:Quad 2-Input NAND Gate
HD74AC00FP 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Quad 2-input NAND Gate
HD74AC00FPEL 制造商:RENESAS 制造商全稱:Renesas Technology Corp 功能描述:Quad 2-Input NAND Gate
HD74AC00P 制造商:RENESAS 制造商全稱:Renesas Technology Corp 功能描述:Quad 2-Input NAND Gate
HD74AC00RPEL 制造商:RENESAS 制造商全稱:Renesas Technology Corp 功能描述:Quad 2-Input NAND Gate
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