參數(shù)資料
型號: UPD44165094AF5-E40Y-EQ2
元件分類: SRAM
英文描述: 2M X 9 QDR SRAM, 0.45 ns, PBGA165
封裝: 13 X 15 MM, PLASTIC, BGA-165
文件頁數(shù): 27/40頁
文件大?。?/td> 388K
代理商: UPD44165094AF5-E40Y-EQ2
33
Data Sheet
M17771EJ3V0DS
μPD44165084A, 44165094A, 44165184A, 44165364A
TAP Controller State Diagram
Test-Logic-Reset
Run-Test / Idle
Select-DR-Scan
Capture-DR
Capture-IR
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Update-IR
Exit2-IR
Pause-IR
Exit1-IR
Shift-IR
Select-IR-Scan
0
1
0
1
0
1
0
1
0
10
11
1
0
1
0
1
0
11
Disabling the Test Access Port
It is possible to use this device without utilizing the TAP. To disable the TAP Controller without interfering with normal
operation of the device, TCK must be tied to VSS to preclude mid level inputs. TDI and TMS may be left open but fix
them to VDD via a resistor of about 1 k
Ω when the TAP controller is not used. TDO should be left unconnected also
when the TAP controller is not used.
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