參數(shù)資料
型號(hào)： TMP470R1B768PGE
廠商： Texas Instruments, Inc.
英文描述： 16/32-Bit RISC Flash Microcontroller
中文描述： 16/32位RISC閃存微控制器
文件頁(yè)數(shù)： 1/50頁(yè)
文件大?。?/td> 393K
代理商： TMP470R1B768PGE
www.ti.com
FEATURES
High-Performance Static CMOS Technology
TMS470R1x 16/32-Bit RISC Core
(ARM7TDM)
– 60-MHz (Pipeline Mode)
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party Support
– Built-In Debug Module
– Utilizes Big-Endian Format
Integrated Memory
– 768K-Byte Program Flash
3 Banks With 18 Contiguous Sectors
Internal State Machine for Programming
and Erase
– 48K-Byte Static RAM (SRAM)
15 Dedicated GIO Pins,1 Input-Only GIO Pin,
and 71 Additional Peripheral I/Os
Operating Features
– Core Supply Voltage (V
CC
): 1.81–2.05 V
– I/O Supply Voltage (V
CCIO
): 3.0–3.6 V
– Low-Power Modes: STANDBY and HALT
– Extended Industrial Temperature Range
470+ System Module
– 32-Bit Address Space Decoding
– Bus Supervision for Memory and
Peripherals
– Analog Watchdog (AWD) Timer
– Real-Time Interrupt (RTI)
– System Integrity and Failure Detection
– Interrupt Expansion Module (IEM)
Direct Memory Access (DMA) Controller
– 32 Control Packets and 16 Channels
Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
– Multiply-by-4 or -8 Internal ZPLL Option
– ZPLL Bypass Mode
TMS470R1B768
16/32-Bit RISC Flash Microcontroller
SPNS108A–AUGUST 2005–REVISED AUGUST 2006
Ten Communication Interfaces:
– Five Serial Peripheral Interfaces (SPIs)
255 Programmable Baud Rates
– Two Serial Communications Interfaces
(SCIs)
2
24
Selectable Baud Rates
Asynchronous/Isosynchronous Modes
– Three High-End CAN Controllers (HECCs)
32-Mailbox Capacity Each
Fully Compliant With CAN Protocol,
Version 2.0B
High-End Timer (HET)
– 32 Programmable I/O Channels:
24 High-Resolution Pins
8 Standard-Resolution Pins
– High-Resolution Share Feature (XOR)
– High-End Timer RAM
128-Instruction Capacity
16-Channel 10-Bit Multi-Buffered ADC
(MibADC)
– 256-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55 μs Minimum Sample and Conversion
Time
– Calibration Mode and Self-Test Features
Eight External Interrupts
Flexible Interrupt Handling
External Clock Prescale (ECP) Module
– Programmable Low-Frequency External
Clock (CLK)
On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1
(1)
(JTAG) Test-Access Port
144-Pin Plastic Low-Profile Quad Flatpack
(PGE Suffix)
(1)
The test-access port is compatible with the IEEE Standard
1149.1-1990,
IEEE Standard Test-Access Port and Boundary
Scan Architecture
specification. Boundary scan is not
supported on this device.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDM is a trademark of Advanced RISC Machines Limited (ARM).
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright 2005–2006, Texas Instruments Incorporated
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