參數(shù)資料
型號(hào)： SCANPSC110FSCX
廠商： FAIRCHILD SEMICONDUCTOR CORP
元件分類(lèi)： 微控制器/微處理器
中文描述： SPECIALTY MICROPROCESSOR CIRCUIT, PDSO28
封裝： 0.300 INCH, MS-013, SOIC-28
文件頁(yè)數(shù)： 12/25頁(yè)
文件大?。?/td> 269K
代理商： SCANPSC110FSCX
www.fairchildsemi.com
2
SCAN
PSC1
10
F
TABLE 1. Glossary of Terms
LFSR
Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial test
data.
LSP
Local Scan Port. A four signal port that drives a “l(fā)ocal” (i.e. non-backplane) scan chain.
(e.g., TCKL1, TMSL1, TDOL1, TDIL1)
Local
Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge Test
Access Port that drives them. The term “l(fā)ocal” was adopted from the system test architecture that the
SCANPSC110F Bridge will most commonly be used in; namely, a system test backplane with a
SCANPSC110F Bridge on each card driving up to 3 “l(fā)ocal” scan rings per card. (Each card can contain
multiple SCANPSC110Fs, with 3 local scan ports per SCANPSC110F.)
Park/Unpark
Park, parked, unpark, and unparked, are used to describe the state of the LSP controller and the state
of the local TAP controllers (the “l(fā)ocal TAP controllers” refers to the TAP controllers of the scan compo-
nents that make up a local scan ring). Park is also used to describe the action of parking a LSP (transi-
tioning into one of the Parked LSP controller states). It is important to understand that when a LSP
controller is in one of the parked states, TMSL is held constant, thereby holding or “parking” the local
TAP controllers in a given state.
TAP
Test Access Port as defined by IEEE Std. 1149.1
Selected/Unselected Selected and Unselected refers to the state of the SCANPSC110F Bridge Selection Controller. A
selected SCANPSC110F has been properly addressed and is ready to receive Level 2 protocol. Unse-
lected SCANPSC110Fs monitor the system test backplane, but do not accept Level 2 protocol (except
for the GOTOWAIT instruction). The data registers and LSPs of unselected SCANPSC110Fs are not
accessible from the system test master.
Active Scan Chain
The Active Scan Chain refers to the scan chain configuration as seen by the test master at a given
moment. When a SCANPSC110F is selected with all of its LSPs parked, the active scan chain is the
current scan bridge register only. When a LSP is unparked, the active scan chain becomes: TDIB → the
current SCANPSC110F register
→ the local scan ring registers → a PAD bit → TDO
B. Refer to Table 4
for Unparked configurations of the LSP network.
Level 1 Protocol
Level 1 is the protocol used to address a SCANPSC110F.
Level 2 Protocol
Level 2 is the protocol that is used once a SCANPSC110F is selected. Level 2 protocol is IEEE Std.
1149.1 compliant when an individual SCANPSC110F is selected.
PAD
A one bit register that is placed at the end of each local scan port scan-chain. The PAD bit eliminates
the prop delay that would be added by the SCANPSC110F LSPN logic between TDILn and TDOL(n+1)
or TDOB by buffering and synchronizing the TDIL inputs to the falling edge of TCKB, thus allowing data
to be scanned at higher frequencies without violating set-up and hold times.
LSB
Least Significant Bit, the right-most position in a register (bit 0)
MSB
Most Significant Bit, the left-most position in a register
相關(guān)PDF資料
PDF描述
SCBA15FF 5 A, SILICON, BRIDGE RECTIFIER DIODE
SCBC21WA4S0000G 21 CONTACT(S), FEMALE, D SUBMINIATURE CONNECTOR, CRIMP
SCBM5W1M/F 5-5 CONTACT(S), PANEL MOUNT, MALE-FEMALE, RECTANGULAR ADAPTER
SCBM5W5M/F 5-5 CONTACT(S), PANEL MOUNT, MALE-FEMALE, RECTANGULAR ADAPTER
SCBM7W2M/F 7-7 CONTACT(S), PANEL MOUNT, MALE-FEMALE, RECTANGULAR ADAPTER
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SCANSTA101 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master
SCANSTA101_06 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master
SCANSTA101SM 功能描述:接口 - 專(zhuān)用 RoHS:否 制造商:Texas Instruments 產(chǎn)品類(lèi)型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:BGA-59
SCANSTA101SM/NOPB 功能描述:接口 - 專(zhuān)用 Low Vltg IEEE 1149.1 Sys Test Access RoHS:否 制造商:Texas Instruments 產(chǎn)品類(lèi)型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:BGA-59
SCANSTA101SM/NOPB 制造商:Texas Instruments 功能描述:Test Master IC
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫(xiě)一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*