參數(shù)資料
型號: MAX5898EGK+D
廠商: Maxim Integrated Products
文件頁數(shù): 22/33頁
文件大小: 0K
描述: IC DAC 16BIT DUAL 500MSPS 68-QFN
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標準包裝: 30
設(shè)置時間: 11ns
位數(shù): 16
數(shù)據(jù)接口: 并聯(lián)
轉(zhuǎn)換器數(shù)目: 2
電壓電源: 模擬和數(shù)字
功率耗散(最大): 831mW
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 68-VFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 68-QFN 裸露焊盤(10x10)
包裝: 管件
輸出數(shù)目和類型: 2 電流,單極
采樣率(每秒): 500M
MAX5898
16-Bit, 500Msps, Interpolating and Modulating
Dual DAC with Interleaved LVDS Inputs
______________________________________________________________________________________
29
Static Performance Parameter
Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from either a best-straight-line
fit (closest approximation to the actual transfer curve)
or a line drawn between the end points of the transfer
function, once offset and gain errors have been nulli-
fied. For a DAC, the deviations are measured at every
individual step.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step height and the ideal value of 1 LSB. A DNL
error specification greater than -1 LSB guarantees a
monotonic transfer function.
Offset Error
The offset error is the difference between the ideal and
the actual offset current. For a DAC, the offset point is
the average value at the output for the two midscale
digital input codes with respect to the full scale of the
DAC. This error affects all codes by the same amount.
Gain Error
A gain error is the difference between the ideal and the
actual full-scale output voltage on the transfer curve,
after nullifying the offset error. This error alters the slope
of the transfer function and corresponds to the same
percentage error in each step.
Dynamic Performance
Parameter Definitions
Settling Time
The settling time is the amount of time required from the
start of a transition until the DAC output settles its new
output value to within the specified accuracy.
Noise Spectral Density
The DAC output noise is the sum of the quantization
noise and thermal noise. Noise spectral density is the
noise power in a 1Hz bandwidth, specified in dBFS/Hz.
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog output (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
maximum SNR can be derived from the DAC’s resolu-
tion (N bits):
SNRdB = 6.02dB x N + 1.76dB
However, noise sources such as thermal noise, refer-
ence noise, clock jitter, etc., affect the ideal reading.
Therefore, SNR is computed by taking the ratio of the
RMS signal to the RMS noise, which includes all spec-
tral components minus the fundamental, the first four
harmonics, and the DC offset.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio of the RMS amplitude of the carrier
frequency (maximum signal components) to the RMS
value of their next largest distortion component. SFDR
is usually measured in dBc with respect to the carrier
frequency amplitude or in dBFS with respect to the
DAC’s full-scale range. Depending on its test condition,
SFDR is observed within a predefined window or
to Nyquist.
Two-/Four-Tone Intermodulation
Distortion (IMD)
The two-/four-tone IMD is the ratio expressed in dBc (or
dBFS) of the worst 3rd-order (or higher) IMD products to
any output tone.
Adjacent Channel Leakage
Power Ratio (ACLR)
Commonly used in combination with WCDMA, ACLR
reflects the leakage power ratio in dB between the
measured powers within a channel relative to its adja-
cent channel. ACLR provides a quantifiable method of
determining out-of-band spectral energy and its influ-
ence on an adjacent channel when a bandwidth-limited
RF signal passes through a nonlinear device.
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