參數(shù)資料
型號： LPC2919
廠商： NXP Semiconductors N.V.
元件分類： 32位微控制器
英文描述： ARM9 microcontroller with CAN and LIN
中文描述： 具有CAN和LIN的ARM9微控制器
文件頁數(shù)： 11/68頁
文件大?。?/td> 384K
代理商： LPC2919
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LPC2917_19_1
NXP B.V. 2007. All rights reserved.
Preliminary data sheet
Rev. 1.01 — 15 November 2007
11 of 68
NXP Semiconductors
LPC2917/19
ARM9 microcontroller with CAN and LIN
7.1.3
IEEE 1149.1 interface pins (JTAG boundary-scan test)
The LPC2917/19 contains boundary-scan test logic according to IEEE 1149.1, also
referred to in this document as Joint Test Action Group (JTAG). The boundary-scan test
pins can be used to connect a debugger probe for the embedded ARM processor. Pin
JTAGSEL selects between boundary-scan mode and debug mode.
Table 5
shows the
boundary- scan test pins.
Table 5.
Symbol
JTAGSEL
7.1.4
Power supply pins description
Table 6
shows the power supply pins.
Table 6.
Symbol
V
DD(CORE)
V
SS(CORE)
V
DD(IO)
V
SS(IO)
V
DD(OSC)
V
SS(OSC)
V
DD(A3V3)
V
SS(PLL)
7.2 Clocking strategy
7.2.1
Clock architecture
The LPC2917/19 contains several different internal clock areas. Peripherals like Timers,
SPI, UART, CAN and LIN have their own individual clock sources called Base Clocks. All
base clocks are generated by the Clock Generator Unit (CGU). They may be unrelated in
frequency and phase and can have different clock sources within the CGU.
The system clock for the CPU and AHB Multilayer Bus infrastructure has its own base
clock. This means most peripherals are clocked independently from the system clock. See
Figure 3
for an overview of the clock areas within the device.
Within each clock area there may be multiple branch clocks, which offers very flexible
control for power-management purposes. All branch clocks are outputs of the Power
Management Unit (PMU) and can be controlled independently. Branch clocks derived
from the same base clock are synchronous in frequency and phase. See
Section 8.8
for
more details of clock and power control within the device.
IEEE 1149.1 boundary-scan test and debug interface
Description
TAP controller select input. LOW level selects ARM debug mode and HIGH level
selects boundary scan and flash programming; pulled up internally
test reset input; pulled up internally (active LOW)
test-mode select input; pulled up internally
test data input, pulled up internally
test data output
test clock input
TRSTN
TMS
TDI
TDO
TCK
Power supplies
Description
digital core supply 1.8 V
digital core ground (digital core, ADC 1)
I/O pins supply 3.3 V
I/O pins ground
oscillator and PLL supply
oscillator ground
ADC 3.3 V supply
PLL ground
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
LPC2919/01 制造商:PHILIPS 制造商全稱:NXP Semiconductors 功能描述:ARM9 microcontroller with CAN and LIN
LPC2919FBD144 制造商:NXP Semiconductors 功能描述:IC MCU 32BIT ARM968 SMD LQFP144
LPC2919FBD144,551 功能描述:ARM微控制器 - MCU ARM968 768K FL/48K RAM LIN 2.0 RoHS:否 制造商:STMicroelectronics 核心:ARM Cortex M4F 處理器系列:STM32F373xx 數(shù)據(jù)總線寬度:32 bit 最大時鐘頻率:72 MHz 程序存儲器大小:256 KB 數(shù)據(jù) RAM 大小:32 KB 片上 ADC:Yes 工作電源電壓:1.65 V to 3.6 V, 2 V to 3.6 V, 2.2 V to 3.6 V 工作溫度范圍:- 40 C to + 85 C 封裝 / 箱體:LQFP-48 安裝風(fēng)格:SMD/SMT
LPC2919FBD144/01 制造商:NXP Semiconductors 功能描述:MCU, 32BIT, ARM968E-S, 125MHZ, LQFP-144 制造商:NXP Semiconductors 功能描述:MCU, 32BIT, ARM968E-S, 125MHZ, LQFP-144, Controller Family/Series:LPC2900, Core Size:32bit, No. of I/O's:108, Supply Voltage Min:1.71V, Supply Voltage Max:1.89V, Digital IC Case Style:LQFP, No. of Pins:144, Program Memory Size:768KB,
LPC2919FBD144/01/ 制造商:NXP Semiconductors 功能描述:MCU ARM9 144LQFP
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