參數(shù)資料
型號(hào): AK4343EN
廠商: Asahi Kasei Microsystems Co.,Ltd
英文描述: Stereo DAC with HP/RCV/SPK-AMP
中文描述: 立體聲DAC惠普/垃圾車/胰腎聯(lián)合移植腺苷
文件頁數(shù): 6/98頁
文件大?。?/td> 851K
代理商: AK4343EN
ASAHI KASEI
[AK4343]
MS0478-E-01
2006/10
- 6 -
Handling of Unused Pin
The unused I/O pins should be processed appropriately as below.
Classification
Pin Name
VCOC/RIN3, SPN, SPP, HPR, HPL, MUTET,
ROUT/RCN, LOUT/RCP, MIN/LIN3,
RIN2/IN2
, LIN2/IN2+, LIN1/IN1
, RIN1/IN1+
MCKO
Digital
MCKI
Setting
Analog
These pins should be open.
This pin should be open.
This pin should be connected to DVSS.
ABSOLUTE MAXIMUM RATINGS
(AVSS, DVSS, HVSS=0V; Note 3)
Parameter
Power Supplies:
Input Current, Any Pin Except Supplies
Analog Input Voltage (Note 5)
Digital Input Voltage (Note 6)
Ambient Temperature (powered applied)
Storage Temperature
Maximum Power Dissipation
Symbol
AVDD
DVDD
HVDD
GND1
GND2
IIN
VINA
VIND
Ta
Tstg
Pd1
Pd2
min
0.3
0.3
0.3
-
-
-
0.3
0.3
30
65
-
-
max
6.0
6.0
6.0
0.3
0.3
±
10
Units
V
V
V
V
V
mA
V
V
°
C
°
C
mW
mW
Analog
Digital
Headphone-Amp / Speaker-Amp
|AVSS – DVSS| (Note 4)
|AVSS – HVSS| (Note 4)
AVDD+0.3
DVDD+0.3
85
150
750
1000
Ta=85
°
C (Note 8)
Ta=70
°
C (Note 9)
(Note 7)
Note 3. All voltages with respect to ground.
Note 4. AVSS, DVSS and HVSS must be connected to the same analog ground plane.
Note 5. I2C, MIN/LIN3, RIN3, RIN2/IN2
, LIN2/IN2+, LIN1/IN1
, RIN1/IN1+ pins
Note 6. PDN, CSN/CAD0, CCLK/SCL, CDTI/SDA, SDTI, LRCK, BICK, MCKI pins
Pull-up resistors at SDA and SCL pins should be connected to (DVDD+0.3)V or less voltage.
Note 7. In case that the exposed pad is connected to the ground and PCB wiring density is 100%. If the exposed pad is
open, Pd1=400mW(max: Speaker-Amp is not available.) and Pd2=550mW(max: Speaker-Amp is available at
HVDD=2.6
3.6V.). This power is the AK4343 internal dissipation that does not include power of externally
connected speaker and headphone.
Note 8. Speaker-Amp is available at HVDD=2.6
3.6V.
Note 9. Speaker-Amp is available at HVDD=2.6
5.25V.
WARNING: Operation at or beyond these limits may result in permanent damage to the device.
Normal operation is not guaranteed at these extremes.
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