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參數(shù)資料
| 型號(hào)： | AD9653BCPZRL7-125 |
| 廠商： | Analog Devices Inc |
| 文件頁(yè)數(shù)： | 23/40頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC 16BIT 125MSPS SRL 48LFCSP |
| 標(biāo)準(zhǔn)包裝： | 750 |
| 位數(shù)： | 16 |
| 采樣率（每秒）： | 125M |
| 數(shù)據(jù)接口： | LVDS，串行，SPI? |
| 轉(zhuǎn)換器數(shù)目： | 4 |
| 功率耗散（最大）： | 708mW |
| 電壓電源： | 模擬和數(shù)字 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 48-WFQFN 裸露焊盤，CSP |
| 供應(yīng)商設(shè)備封裝： | 48-LFCSP-WQ（7x7） |
| 包裝： | 帶卷 (TR) |
| 輸入數(shù)目和類型： | 4 個(gè)差分，單極 |
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Data Sheet
AD9653
Rev. 0 | Page 3 of 40
SPECIFICATIONS
DC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2.0 V p-p full-scale differential input at 1.0 dBFS; VREF = 1.0 V, DCS off, unless otherwise noted.
Table 1.
Temperature
Min
Typ
Max
Unit
RESOLUTION
16
Bits
ACCURACY
No Missing Codes
Full
Guaranteed
Offset Error
Full
0.49
0.3
0.17
% FSR
Offset Matching
Full
0.14
+0.2
0.39
% FSR
Gain Error
Full
12.3
5
2.37
% FSR
Gain Matching
Full
1.0
1.1
5.8
% FSR
Differential Nonlinearity (DNL)
Full
0.77
0.95
LSB
25°C
±0.7
LSB
Integral Nonlinearity (INL)
Full
7.26
8.18
LSB
25°C
±3.5
LSB
TEMPERATURE DRIFT
Offset Error
Full
3.5
ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage (1.0 V Mode)
Full
0.98
1.0
1.01
V
Load Regulation at 1.0 mA (V
REF = 1.0 V)
Full
2
mV
Input Resistance
25°C
7.5
kΩ
INPUT-REFERRED NOISE
V
REF = 1.0 V
25°C
2.7
LSB rms
ANALOG INPUTS
Differential Input Voltage (V
REF = 1.0 V)
Full
2
V p-p
Common-Mode Voltage
Full
0.9
V
Common-Mode Range
25°C
0.5
1.3
V
Differential Input Resistance
25°C
2.6
kΩ
Differential Input Capacitance
25°C
7
pF
POWER SUPPLY
AVDD
Full
1.7
1.8
1.9
V
DRVDD
Full
1.7
1.8
1.9
V
I
AVDD
Full
305
330
mA
I
DRVDD (ANSI-644 Mode)
Full
60
64
mA
I
DRVDD (Reduced Range Mode)
25°C
45
mA
TOTAL POWER CONSUMPTION
DC Input
Full
607
649
mW
Sine Wave Input (Four Channels Including Output Drivers, ANSI-644 Mode)
Full
657
708
mW
Sine Wave Input (Four Channels Including Output Drivers, Reduced Range Mode)
25°C
630
mW
Power-Down
25°C
2
mW
Standby3
Full
356
392
mW
1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2 Measured with a low input frequency, full-scale sine wave on all four channels.
3 Can be controlled via the SPI.
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