參數(shù)資料
型號(hào): MC74AC00DT
廠商: ON SEMICONDUCTOR
元件分類(lèi): 門(mén)電路
英文描述: AC SERIES, QUAD 2-INPUT NAND GATE, PDSO14
封裝: PLASTIC, TSSOP-14
文件頁(yè)數(shù): 31/45頁(yè)
文件大?。?/td> 434K
代理商: MC74AC00DT
http://onsemi.com
41
Transmission line theory states the voltage level of this
current wave is equal to the current in the line times the
impedance of the line. With typical currents as low as 5 mA
and impedances of 50 to 60 ohms, this voltage step can be
as minimal has 250 mV. If the comparator was programmed
to the 10% point, it would be looking for a step of 550 mV
at 5.5 V VCC. Three reflections of the current pulse would
be required before the comparator would detect the level. It
is this added delay time caused by the transmission line
environment of the ATE that may cause parts to fail
customers’ incoming tests, even though the device meets
specifications. The figure below graphically shows this
stepout.
AB
C
5
4
3
2
1
0
1 2 3 4 5 6 78 9 10 11 12
TIME(ns)
VOL
TAGE
(V)
OE
OUTPUT
Figure 1–56. Measurement Stepout
Point A represents the typical 50% measurement point on
tester driven waveforms. Point B represents the point at
which the delay time would be measured on a bench test
fixture. Point C represents where the delay time could be
measured on ATE fixtures. The delay time measured on the
ATE fixture can vary from the bench measured delay time
to some greater value, depending upon the voltage level that
the tester is set. If the voltage level of the tester is close to
voltage levels of the plateaus, the results may become
non-repeatable.
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