參數(shù)資料
型號(hào): GS4900BCNE3
廠商: Gennum Corporation
英文描述: SD Clock and Timing Generator with GENLOCK
中文描述: 統(tǒng)計(jì)時(shí)鐘和定時(shí)發(fā)生器鎖相
文件頁(yè)數(shù): 17/95頁(yè)
文件大?。?/td> 898K
代理商: GS4900BCNE3
GS4901B/GS4900B Preliminary Data Sheet
37703 - 0
April 2006
17 of 95
51
PCLK1
Output
CLOCK SIGNAL OUTPUT
Signal levels are LVCMOS/LVTTL compatible.
Video clock output signal.
PCLK1 presents a video sample rate clock output to the application
layer.
By default, after system reset, the PCLK1 output pin will operate at the
fundamental frequency determined by the setting of the VID_STD[5:0]
pins. It is possible to define other non-standard fundamental clock rates
using the host interface.
It is also possible to select different division ratios for the PCLK1 output
by programming designated registers in the host interface. A clock
output of the fundamental rate, fundamental rate ÷2, or fundamental rate
÷4 may be selected.
By setting designated registers in the host interface, the current drive
capability of this pin may be set high or low. By default, the current drive
will be low.
The PCLK1 output will be held LOW when VID_STD[5:0] = 00h.
52
PCLK1&2_GND
Power
Supply
Ground connection for PCLK1&2 circuitry. Connect to GND.
53
PCLK1&2_VDD
Power
Supply
Most positive power supply connection for PCLK1&2 circuitry. Connect to
+1.8V DC.
54
PhS_VDD
Power
Supply
Most positive power supply connection for the video clock phase shift
internal block. Connect to +1.8V DC.
55
PhS_GND
Power
Supply
Ground connection for the video clock phase shift internal block. Connect
to GND.
56
JTAG/HOST
Non
Synchronous
Input
CONTROL SIGNAL INPUT
Signal levels are LVCMOS/LVTTL compatible.
Used to select JTAG Test Mode or Host Interface Mode.
When set HIGH, CS_TMS, SCLK_TCLK, SDOUT_TDO, and SDIN_TDI
are configured for JTAG boundary scan testing.
When set LOW, CS_TMS, SCLK_TCLK, SDOUT_TDO, and SDIN_TDI
are configured as GSPI pins for normal host interface operation.
57
SCLK_TCLK
Non
Synchronous
Input
SIGNAL INPUT
Signal levels are LVCMOS/LVTTL compatible.
Serial Data Clock / Test Clock.
All JTAG / Host Interface address and data are shifted into/out of the
device synchronously with this clock.
Host Mode (JTAG/HOST = LOW):
SCLK_TCLK operates as the host interface serial data clock, SCLK.
JTAG Test Mode (JTAG/HOST = HIGH):
SCLK_TCLK operates as the JTAG test clock, TCLK.
Table 1-1: Pin Descriptions (Continued)
Pin
Number
Name
Timing
Type
Description
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