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| 型號： | ADSP-BF547YBCZ-4A |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 88/100頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC DSP BLACKFIN 400MHZ 400CSPBGA |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | Blackfin® |
| 類型： | 定點(diǎn) |
| 接口： | SPI，SSP，TWI，UART，USB |
| 時(shí)鐘速率： | 400MHz |
| 非易失內(nèi)存： | 外部 |
| 芯片上RAM： | 260kB |
| 電壓 - 輸入/輸出： | 2.50V，3.30V |
| 電壓 - 核心： | 1.25V |
| 工作溫度： | -40°C ~ 105°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 400-LFBGA，CSPBGA |
| 供應(yīng)商設(shè)備封裝： | 400-CSPBGA（17x17） |
| 包裝： | 托盤 |
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Rev. D
|
Page 88 of 100
|
May 2011
ADSP-BF542/ADSP-BF544/ADSP-BF547/ADSP-BF548/ADSP-BF549
TEST CONDITIONS
All timing parameters appearing in this data sheet were mea-
sured under the conditions described in this section. Figure 72
shows the measurement point for AC measurements (except
output enable/disable). The measurement point VMEAS is
VDDEXT/2 or VDDDDR/2, depending on the pin under test.
Output Enable Time
Output pins are considered to be enabled when they have made
a transition from a high-impedance state to the point when they
start driving. The output enable time tENA is the interval from
the point when a reference signal reaches a high or low voltage
level to the point when the output starts driving as shown in the
output enable/disable diagram (Figure 73). The time,
tENA_MEASURED, is the interval from the point when the reference
signal switches to the point when the output voltage reaches
either 1.75 V (output high) or 1.25 V (output low). Time tTRIP is
the interval from when the output starts driving to when the
output reaches the 1.25 V or 1.75 V trip voltage. Time tENA is
calculated as shown in the equation:
If multiple pins (such as the data bus) are enabled, the measure-
ment value is that of the first pin to start driving.
Output Disable Time
Output pins are considered to be disabled when they stop driv-
ing, go into a high-impedance state, and start to decay from
their output high or low voltage. The time for the voltage on the
bus to decay by
ΔV is dependent on the capacitive load, C
L and
the load current, IL. This decay time can be approximated by the
equation:
The output disable time tDIS is the difference between
tDIS_MEASURED is the interval from when the reference signal
switches to when the output voltage decays
ΔV from the mea-
sured output high or output low voltage. The time tDECAY is
calculated with test loads CL and IL, and with ΔV equal to 0.25 V.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate tDECAY using the equation given above. Choose ΔV
to be the difference between the ADSP-BF54x Blackfin proces-
sors’ output voltage and the input threshold for the device
requiring the hold time. A typical
ΔV will be 0.4 V. C
L is the total
bus capacitance (per data line), and IL is the total leakage or
three-state current (per data line). The hold time will be tDECAY
plus the minimum disable time (for example, tDDAT for an asyn-
chronous memory write cycle).
CAPACITIVE LOADING
Output delays and holds are based on standard capacitive loads
of an average of 6 pF on all balls (see Figure 74).
VLOAD is equal to VDDEXT/2 or VDDDDR/2, depending on the pin
under test.
Figure 72. Voltage Reference Levels for AC Measurements
(Except Output Enable/Disable)
INPUT
OR
OUTPUT
VMEAS
t
ENA
t
ENA_MEASURED
t
TRIP
–
=
t
DECAY
C
L
V
Δ
() I
L
=
Figure 73. Output Enable/Disable
Figure 74. Equivalent Device Loading for AC Measurements
(Includes All Fixtures)
REFERENCE
SIGNAL
tDIS
OUTPUT STARTS DRIVING
VOH (MEASURED)
V
VOL (MEASURED) + V
tDIS_MEASURED
VOH
(MEASURED)
VOL
(MEASURED)
VTRIP(HIGH)
VOH(MEASURED)
VOL(MEASURED)
HIGH IMPEDANCE STATE
OUTPUT STOPS DRIVING
tENA
tDECAY
tENA_MEASURED
tTRIP
VTRIP(LOW)
T1
ZO = 50
Ω (impedance)
TD = 4.04
± 1.18 ns
2pF
TESTER PIN ELECTRONICS
50
Ω
0.5pF
70
Ω
400
Ω
45
Ω
4pF
NOTES:
THE WORST-CASE TRANSMISSION LINE DELAY IS SHOWN AND CAN BE USED
FOR THE OUTPUT TIMING ANALYSIS TO REFELECT THE TRANSMISSION LINE
EFFECT AND MUST BE CONSIDERED. THE TRANSMISSION LINE (TD), IS FOR
LOAD ONLY AND DOES NOT AFFECT THE DATA SHEET TIMING SPECIFICATIONS.
ANALOG DEVICES RECOMMENDS USING THE IBIS MODEL TIMING FOR A GIVEN
SYSTEM REQUIREMENT. IF NECESSARY, A SYSTEM MAY INCORPORATE
EXTERNAL DRIVERS TO COMPENSATE FOR ANY TIMING DIFFERENCES.
VLOAD
DUT
OUTPUT
50
Ω
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
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| ADSP-BF548BBCZ | 制造商:Analog Devices 功能描述: |
| ADSP-BF548BBCZ-5A | 功能描述:IC DSP 16BIT 533MHZ 400CSBGA RoHS:是 類別:集成電路 (IC) >> 嵌入式 - DSP（數(shù)字式信號處理器） 系列:Blackfin® 標(biāo)準(zhǔn)包裝:40 系列:TMS320DM64x, DaVinci™ 類型:定點(diǎn) 接口:I²C，McASP，McBSP 時(shí)鐘速率:400MHz 非易失內(nèi)存:外部 芯片上RAM:160kB 電壓 - 輸入/輸出:3.30V 電壓 - 核心:1.20V 工作溫度:0°C ~ 90°C 安裝類型:表面貼裝 封裝/外殼:548-BBGA，F(xiàn)CBGA 供應(yīng)商設(shè)備封裝:548-FCBGA（27x27） 包裝:托盤 配用:TMDSDMK642-0E-ND - DEVELPER KIT W/NTSC CAMERA296-23038-ND - DSP STARTER KIT FOR TMS320C6416296-23059-ND - FLASHBURN PORTING KIT296-23058-ND - EVAL MODULE FOR DM642TMDSDMK642-ND - DEVELOPER KIT W/NTSC CAMERA |
| ADSP-BF548BBCZ-5AA | 功能描述:IC DSP 16BIT 533MHZ 400CSBGA 制造商:analog devices inc. 系列:Blackfin? 包裝:托盤 零件狀態(tài):有效 類型:定點(diǎn) 接口:CAN，SPI，SSP，TWI，UART，USB 時(shí)鐘速率:533MHz 非易失性存儲器:外部 片載 RAM:260kB 電壓 - I/O:2.50V，3.30V 電壓 - 內(nèi)核:1.25V 工作溫度:-40°C ~ 85°C（TA） 安裝類型:表面貼裝 封裝/外殼:400-LFBGA，CSPBGA 供應(yīng)商器件封裝:400-CSPBGA（17x17） 標(biāo)準(zhǔn)包裝:1 |
| ADSP-BF548BBCZ-5X | 制造商:Analog Devices 功能描述:- Trays |
| ADSP-BF548MBBCZ-5M | 功能描述:IC DSP 533MHZ W/DDR 400CSPBGA RoHS:是 類別:集成電路 (IC) >> 嵌入式 - DSP（數(shù)字式信號處理器） 系列:Blackfin® 標(biāo)準(zhǔn)包裝:40 系列:TMS320DM64x, DaVinci™ 類型:定點(diǎn) 接口:I²C，McASP，McBSP 時(shí)鐘速率:400MHz 非易失內(nèi)存:外部 芯片上RAM:160kB 電壓 - 輸入/輸出:3.30V 電壓 - 核心:1.20V 工作溫度:0°C ~ 90°C 安裝類型:表面貼裝 封裝/外殼:548-BBGA，F(xiàn)CBGA 供應(yīng)商設(shè)備封裝:548-FCBGA（27x27） 包裝:托盤 配用:TMDSDMK642-0E-ND - DEVELPER KIT W/NTSC CAMERA296-23038-ND - DSP STARTER KIT FOR TMS320C6416296-23059-ND - FLASHBURN PORTING KIT296-23058-ND - EVAL MODULE FOR DM642TMDSDMK642-ND - DEVELOPER KIT W/NTSC CAMERA |
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