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鍨嬭櫉(h脿o)锛� A3P125-1VQ100T
寤�(ch菐ng)鍟嗭細 Microsemi SoC
鏂囦欢闋�(y猫)鏁�(sh霉)锛� 185/220闋�(y猫)
鏂囦欢澶�?銆�?/td> 0K
鎻忚堪锛� IC FPGA 1KB FLASH 125K 100-VQFP
妯�(bi膩o)婧�(zh菙n)鍖呰锛� 90
绯诲垪锛� ProASIC3
RAM 浣嶇附瑷�(j矛)锛� 36864
杓稿叆/杓稿嚭鏁�(sh霉)锛� 71
闁€(m茅n)鏁�(sh霉)锛� 125000
闆绘簮闆诲锛� 1.425 V ~ 1.575 V
瀹夎椤�(l猫i)鍨嬶細 琛ㄩ潰璨艰
宸ヤ綔婧害锛� -40°C ~ 125°C
灏佽/澶栨锛� 100-TQFP
渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁濓細 100-VQFP锛�14x14锛�
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ProASIC3 Flash Family FPGAs
Revision 13
2-53
Table 2-68 Minimum and Maximum DC Input and Output Levels
Applicable to Standard I/O Banks
1.8 V
LVCMOS
VIL
VIH
VOL
VOH
IOL IOH
IOSL
IOSH IIL1 IIH2
Drive
Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max.
V
Min.
VmA mA
Max.
mA3
Max.
mA3
A4 A4
2 mA
鈥�0.3
0.35 * VCCI
0.65 * VCCI
3.6
0.45
VCCI 鈥� 0.45
2
9
11
10
4 mA
鈥�0.3
0.35 * VCCI
0.65 * VCCI
3.6
0.45
VCCI 鈥� 0.45
4
17
22
10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where 鈥�0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100掳C junction temperature) and maximum voltage.
4. Currents are measured at 85掳C junction temperature.
5. Software default selection highlighted in gray.
Figure 2-8 AC Loading
Table 2-69 AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V)
Input High (V)
Measuring Point* (V)
CLOAD (pF)
01.8
0.9
35
Note: *Measuring point = Vtrip. See Table 2-22 on page 2-21 for a complete table of trip points.
Test Point
Enable Path
Datapath
35 pF
R = 1 k
R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
35 pF for tZH / tZHS / tZL / tZLS
35 pF for tHZ / tLZ
鐩搁棞(gu膩n)PDF璩囨枡
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